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Volumn 194, Issue 1, 2009, Pages 214-219

In situ Van der Pauw measurements of the Ni/YSZ anode during exposure to syngas with phosphine contaminant

Author keywords

Anode resistivity; Degradation; Phosphine; SOFC; Syngas; Van der Pauw method

Indexed keywords

ACTIVE LAYER; ANODE SURFACES; ANODE-SUPPORTED; BRIDGING TECHNOLOGY; CELL VOLTAGES; COMPOSITE ANODES; CONSTANT CURRENT; DEGRADATION OF CELL PERFORMANCE; ELECTROCHEMICAL METHODS; IMPEDANCE SPECTROSCOPY; IN-SITU; LOSS OF PERFORMANCE; OXIDATION STATE; PHOSPHINE; POLARIZATION CURVES; POLARIZATION RESISTANCES; POSITIVE OXIDATION STATE; REACTION PRODUCTS; RESISTIVITY MEASUREMENT; SERIES RESISTANCES; SOFC; SUPPORT LAYER; SYNGAS; SYNGAS MIXTURES; VAN DER PAUW; VAN DER PAUW METHOD; VOLTAGE LOSS; XPS; XRD ANALYSIS; YSZ ELECTROLYTES;

EID: 68149168438     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2009.04.071     Document Type: Article
Times cited : (12)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.