SCOPUS 정보 검색 플랫폼

Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 8, 2009, Pages 1111-1114

Sulfur-induced offsets in MC-ICP-MS silicon-isotope measurements

(3) Van Den Boorn, Sander H J M a,c Vroon, Pieter Z b Van Bergen, Manfred J a

a UTRECHT UNIVERSITY (Netherlands)

b VU UNIVERSITY AMSTERDAM (Netherlands)

c SHELL GLOBAL SOLUTIONS INTERNATIONAL B V (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANIONIC SPECIES; CATION EXCHANGES; GEOLOGICAL MATERIALS; ISOTOPE ANALYSIS; ISOTOPE MEASUREMENTS; MC-ICP-MS; SAMPLE PREPARATION METHODS; SOLID SAMPLES;

INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ISOTOPES; MASS SPECTROMETERS; PURIFICATION; SEMICONDUCTOR COUNTERS; SULFUR;

SILICON;

EID: 68149162950 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b816804k Document Type: Article

Times cited : (49)

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