SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 21, Issue 28, 2009, Pages 2899-2902

Silicon direct opals

(3) Ibisate, Maria a Golmayo, Dolores a López, Cefe a

a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL QUALITIES; CVD PROCESS; DIELECTRIC CONSTANTS; HCL SOLUTION; MAGNESIOTHERMIC REDUCTION; OPTICAL SPECTROSCOPY; POROUS NATURE; SELECTIVE ETCHING; SEM; SILICA OPALS; SILICA SPHERE; TEM; X- RAY DIFFRACTION;

CHEMICAL VAPOR DEPOSITION; HYDROCHLORIC ACID; LIGHT TRANSMISSION; MAGNESIA; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICA; SILICATE MINERALS; SPHERES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

SILICON;

EID: 68149154935 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200900188 Document Type: Article

Times cited : (51)

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