The third- and fifth-order nonlinear refraction in the single- and double-sided TMAF/PSS electrostatic self-assembly films

Journal of Nonlinear Optical Physics and Materials

Volumn 17, Issue 4, 2008, Pages 487-493

  Ouyang, Qiuyun ^a   Zhang, Xueru ^b   Song, Yinglin ^b  

^a HARBIN ENGINEERING UNIVERSITY   (China)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Electrostatic self assembly films; Nonlinear refraction; Z scan

Indexed keywords

ELECTROSTATICS; REFRACTION; SELF ASSEMBLY;

ELECTROSTATIC SELF ASSEMBLY; METHANOFULLERENES; NEGATIVELY CHARGED; NON-LINEAR REFRACTION; POSITIVELY CHARGED; THIRD-ORDER NON-LINEARITY; Z-SCAN; Z-SCAN TECHNIQUE;

FILMS;

EID: 68149152995     PISSN: 02188635     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218863508004366     Document Type: Article

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