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Materials Transactions

Volumn 50, Issue 6, 2009, Pages 1576-1578

Yield-point phenomena of Ti-20V-4Al-1Sn at 1073 K and its constitutive modelling

(7) Wang, X a Hamasaki, H b Yamamura, M b Yamauchi, R b Maeda, T c,d Shirai, Y c Yoshida, F b

a HARBIN INSTITUTE OF TECHNOLOGY (China)

b HIROSHIMA UNIVERSITY (Japan)

c Sumitomo Metal Industries Ltd (Japan)

d JFE Mineral Co (Japan)

Author keywords

Electron backscattering diffraction; High temperature deformation; Modelling; Titanium alloys; Yield phenomena

Indexed keywords

CONSTITUTIVE MODELLING; DEFORMATION BEHAVIOUR; DISLOCATION MULTIPLICATION; DYNAMIC RECOVERY; EBSD ANALYSIS; ELECTRON BACKSCATTERING DIFFRACTION; HIGH TEMPERATURE DEFORMATION; MIS-ORIENTATION; MODELLING; STRAIN SOFTENING; STRESS-STRAIN RESPONSE; UNIAXIAL TENSIONS; VISCOPLASTIC; YIELD PHENOMENA; YIELD POINTS;

ALLOYS; ALUMINUM; BACKSCATTERING; DEFORMATION; DIFFRACTION; ELECTRON SCATTERING; IMPLANTS (SURGICAL); STRESS-STRAIN CURVES; TIN; TIN ALLOYS; TITANIUM;

TITANIUM ALLOYS;

EID: 68149139628 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.M2009059 Document Type: Article

Times cited : (32)

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