Random texture defect detection using 1-D hidden markov models based on local binary patterns

IEICE Transactions on Information and Systems

Volumn E91-D, Issue 7, 2008, Pages 1937-1945

  Hadizadeh, Hadi ^a   Shokouhi, Shahriar Baradaran ^a  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

Author keywords

Hidden markov models; Local binary patterns; Random texture; Texture defect detection

Indexed keywords

DEFECTS; GRAPHIC METHODS; IMAGE TEXTURE; MARKOV PROCESSES;

LOCAL BINARY PATTERNS; MODEL SELECTION PROBLEM; MULTI-SCALE FRAMEWORKS; NOVELTY DETECTION; PREDICTION ERRORS; RANDOM TEXTURES; TEXTURE DEFECT DETECTION; TEXTURE DESCRIPTOR;

HIDDEN MARKOV MODELS;

EID: 68149131526     PISSN: 09168532     EISSN: 17451361     Source Type: Journal    
DOI: 10.1093/ietisy/e91-d.7.1937     Document Type: Conference Paper

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