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Volumn , Issue 178, 2009, Pages 149-156
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A suite of hybrid simulation schemes for nano-to-micrometer scale processes at solid-fluid interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 68049133147
PISSN: 03759687
EISSN: 13474081
Source Type: Journal
DOI: 10.1143/PTPS.178.149 Document Type: Conference Paper |
Times cited : (1)
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References (13)
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