Simultaneous particle size and concentration measurements using a back-lighted particle imaging system

Flow Measurement and Instrumentation

Volumn 20, Issue 4-5, 2009, Pages 189-199

  Lee, Cheegwan ^a   Wu, Chin H ^b   Hoopes, John A ^b  

^a BATTELLE MEMORIAL INSTITUTE   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

Back lighting; Concentration; Depth of field variations; Digital image analysis; In focus parameter; Particle size distribution; Resuspension

Indexed keywords

BACK-LIGHTING; CONCENTRATION; DEPTH-OF-FIELD VARIATIONS; DIGITAL IMAGE ANALYSIS; IN-FOCUS PARAMETER; RESUSPENSION;

CONCENTRATION (PROCESS); DIGITAL IMAGE STORAGE; IMAGE ANALYSIS; IMAGING SYSTEMS; LIGHTING; OPTOELECTRONIC DEVICES; PARTICLE SIZE; POISSON DISTRIBUTION; SIZE DISTRIBUTION; UNCERTAINTY ANALYSIS;

PARTICLE SIZE ANALYSIS;

EID: 68049107194     PISSN: 09555986     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.flowmeasinst.2009.06.002     Document Type: Article

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