ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride

Corrosion Science

Volumn 51, Issue 9, 2009, Pages 1883-1886

  Seyeux, Antoine ^a   Liu, Ming ^a,b,c   Schmutz, Patrik ^c   Song, Guangling ^b   Atrens, Andrej ^a,b,c   Marcus, Philippe ^a  

^a CNRS   (France)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

A. Magnesium; B. ToF SIMS

Indexed keywords

EID: 68049097014     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2009.06.002     Document Type: Letter

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