Metal-Enhanced Fluorescence (MEF): Physical characterization of Silver-island films and exploring sample geometries

Chemical Physics Letters

Volumn 478, Issue 1-3, 2009, Pages 70-74

  Pribik, R ^a   Dragan, A I ^a   Zhang, Y ^a   Gaydos, C ^b   Geddes, C D ^a  

^a UNIVERSITY OF MARYLAND BIOTECHNOLOGY INSTITUTE   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TIME; EF VALUE; ELECTRICAL CONDUCTIVITY; HIGH SENSITIVITY; ISLAND FILMS; METAL-ENHANCED FLUORESCENCE; OPTICAL DENSITIES; PHYSICAL CHARACTERIZATION; SAMPLE GEOMETRY; SHARP INCREASE; SILVER ISLANDS;

CHEMICAL VAPOR DEPOSITION; COMPUTATIONAL GEOMETRY; ELECTRIC CONDUCTIVITY; FLUORESCENCE; OPTICAL CONDUCTIVITY; PLASMONS; STRESS INTENSITY FACTORS;

SILVER;

EID: 68049087758     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2009.07.033     Document Type: Article

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