Single-component reflecting objective for ultraviolet imaging and spectroscopy at cryogenic temperature

Journal of the Optical Society of America B: Optical Physics

Volumn 26, Issue 7, 2009, Pages 1395-1399

  Fujiwara, Masanori ^a   Fujiyoshi, Satoru ^a   Matsushita, Michio ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CRYOGENICS; LIQUEFIED GASES; MIRRORS; SILICA; SUPERFLUID HELIUM;

CHROMATIC ABERRATION; CRYOGENIC CONDITIONS; CRYOGENIC TEMPERATURES; DIFFRACTION LIMITED; NUMERICAL APERTURE; SINGLE COMPONENTS; ULTRAVIOLET IMAGING; WAVELENGTH REGIONS;

REFLECTION;

EID: 67849104743     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.26.001395     Document Type: Article

References (8)

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7. ZEMAX-EE version August 1, 2006, ZEMAX Development Corporation, Bellevue, Wash., USA, 2006.
8. In the measurement of Figs. 3(a) and 3(b) of our previous work in [4], we erroneously measured the backside of the sample plate. This causes the inconsistency between Figs. 3(a) and 3(b) of [4] and Fig. 6(b) of this paper. In [4] the blue curve of the shorter wavelength peaks at a positiveδz and the red of the longer wavelength at a negative-z, but vice versa in this work.