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Volumn 8, Issue 4, 2009, Pages 521-531

Unified framework for developing testing effort dependent software reliability growth models

Author keywords

Convolution; Error generation; Imperfect debugging; Probability distribution function; Software reliability growth model; Testing effort function

Indexed keywords

CONSUMPTION PATTERNS; CPU TIME; DATA ANALYSIS; ERROR GENERATION; FAULT REMOVAL; GROWTH CURVES; IMPERFECT DEBUGGING; MODEL SELECTION; REALISTIC MODELING; RELIABILITY GROWTH; SOFTWARE FAILURE; SOFTWARE RELIABILITY GROWTH MODEL; SOFTWARE RELIABILITY GROWTH MODELS; TEST CASE; TESTING EFFORT; TESTING EFFORT FUNCTION; TESTING ENVIRONMENT; UNIFIED FRAMEWORK;

EID: 67849086885     PISSN: 11092777     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.