Nanoparticle doped in-cell retarder for low operating voltage in transflective liquid crystal displays

Japanese Journal of Applied Physics

Volumn 48, Issue 4, 2009, Pages

  Lee, Gak Seok ^a   Lee, Jeong Hyun ^a   Kim, Jae Chang ^a   Yoon, Tae Hoon ^a   Kim, Jin Hwan ^b   Yu, Jae Ho ^b   Choi, Hwan Young ^b  

^a Pusan National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; DOPING NANOPARTICLES; HIGH DIELECTRIC CONSTANTS; IN-CELL; IN-CELL RETARDER; LOW OPERATING VOLTAGE; OPERATING VOLTAGE; TIO; TRANSFLECTIVE; TRANSFLECTIVE LCD; TRANSFLECTIVE LIQUID CRYSTAL DISPLAY; VERTICAL ALIGNMENT;

CELL MEMBRANES; CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; DOPING (ADDITIVES); ELECTRIC FIELDS; ELECTRIC POTENTIAL; LIGHT SOURCES; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; MATERIALS; NANOPARTICLES; PERMITTIVITY;

CYTOLOGY;

EID: 67749152081     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.042405     Document Type: Article

References (13)

1. M. Kubo, T. Ochi, Y. Narutaki, T. Shinomiya, and Y. Ishii: J. Soc. Inf. Disp. 8 (2000) 299.
2. H.-I. Baek, Y.-B. Kim, K.-S. Ha, D.-G. Kim, and S.-B. Kwon: Proc. Int. Display Workshop'00, 2000, p. 4.
3. S. H. Lee, H. W. Do, G.-D. Lee, T.-H. Yoon, and J. C. Kim: Jpn. J. Appl. Phys. 42 (2003) L1455.
4. G. S. Lee, J. C. Kim, and T.-H. Yoon: Jpn. J. Appl. Phys. 45 (2006) 8769.
5. M. Schadt, K. Schmitt, V. Kozinkov, and V. Ghigrinov: Jpn. J. Appl. Phys. 31 (1992) 2155.
6. M. Schadt, H. Seiberle, A. Schuster, and S. M. Kelly: Jpn. J. Appl. Phys. 34 (1995) 3240.
7. B. M. I. Van Der Zande, A. C. Nieuwkerk, M. Van Deurzen, C. A. Renders, E. Peeters, and S. J. Roosendal: SID Int. Symp. Dig. Tech. Pap. 34 (2003) 194.
8. C. Doornkamp, S. J. Roosendaal, B. M. I. J. T. M. Van Der Zande, L. W. G. Stofmeel, J. J. Van Glabbeek, and J. T. M. Osenga: SID Int. Symp. Dig. Tech. Pap. 35 (2004) 670.
9. J. H. Song, Y. J. Kim, M.-H. Lee, S. K. Lee, and S. T. Shin: Appl. Phys. Lett. 87 (2005) 011108.
10. K.-H. Park, J. C. Kim, and T.-H. Yoon: Jpn. J. Appl. Phys. 44 (2005) 210.
11. K.-H. Park, Y. J. Ko, J. S. Gwag, J. C. Kim, and T.-H. Yoon: Mol. Cryst. Liq. Cryst. 434 (2005) 79.
12. H. Imayama, J. Tanno, K. Igeta, M. Morimoto, S. Komura, T. Nagat, O. Itou, and S. Hirota: SID Int. Symp. Dig. Tech. Pap. 38 (2007) 1651.
13. G. Raju: Proc. IEEE Conf. Electrical Insulation and Dielectric Phenomena, 1988, p. 357.