-
2
-
-
1642325089
-
-
Kneipp, K.; Wang, Y.; Kneipp, H.; Perelman, L. T.; Itzkan, L; Dasari, R.; Feld, M. S. Phys. Rev. Lett. 1997, 78, 1667.
-
(1997)
Phys. Rev. Lett
, vol.78
, pp. 1667
-
-
Kneipp, K.1
Wang, Y.2
Kneipp, H.3
Perelman, L.T.4
Itzkan, L.5
Dasari, R.6
Feld, M.S.7
-
4
-
-
37549025447
-
-
Dieringer, J. A.; Lettan, R. B.; Scheidt, K. A.; Van Duyne. R. P. J.Am. Chem. Soc. 2007, 129, 16249.
-
(2007)
J.Am. Chem. Soc
, vol.129
, pp. 16249
-
-
Dieringer, J.A.1
Lettan, R.B.2
Scheidt, K.A.3
Van Duyne, R.P.4
-
9
-
-
0033520760
-
-
Michaels, A. M.; Nirmal, M.; Brus, L. E. J. Am. Chem. Soc. 1999, 121, 9932.
-
(1999)
J. Am. Chem. Soc
, vol.121
, pp. 9932
-
-
Michaels, A.M.1
Nirmal, M.2
Brus, L.E.3
-
10
-
-
19744371519
-
-
Moore. A. A.; Jacobson, M. L.; Belabas, N.; Rowlen, K. L.; Jonas, D. M. J. Am. Chem. Soc. 2005, 127, 7292.
-
(2005)
J. Am. Chem. Soc
, vol.127
, pp. 7292
-
-
Moore, A.A.1
Jacobson, M.L.2
Belabas, N.3
Rowlen, K.L.4
Jonas, D.M.5
-
11
-
-
0034270033
-
-
Xu, H. X.; Aizpurua, J.; Kall, M.; Apell, P. Phys. Rev. E 2000, 62, 4318.
-
(2000)
Phys. Rev. E
, vol.62
, pp. 4318
-
-
Xu, H.X.1
Aizpurua, J.2
Kall, M.3
Apell, P.4
-
12
-
-
42149122718
-
-
Shim, S.; Stuart, C. M.; Mathies, R. A. ChemPhysChem 2008, 9, 697.
-
(2008)
ChemPhysChem
, vol.9
, pp. 697
-
-
Shim, S.1
Stuart, C.M.2
Mathies, R.A.3
-
13
-
-
52449135136
-
-
Camden. J. P.; Dieringer, J. A.; Wang. Y. M.; Masiello, D. J.; Marks, L. D.; Schatz, G. C.; Van Duyne. R. P. J. Am, Chem. Soc. 2008. 130. 12616.
-
(2008)
J. Am, Chem. Soc
, vol.130
, pp. 12616
-
-
Camden, J.P.1
Dieringer, J.A.2
Wang, Y.M.3
Masiello, D.J.4
Marks, L.D.5
Schatz, G.C.6
Van Duyne, R.P.7
-
14
-
-
34948848170
-
-
Le Ru, E. C.; Blackie, E.; Meyer. M.; Etchegoin, P. G. J.Phys. Chem. C 2007, 111, 13794.
-
(2007)
J.Phys. Chem. C
, vol.111
, pp. 13794
-
-
Le Ru, E.C.1
Blackie, E.2
Meyer, M.3
Etchegoin, P.G.4
-
16
-
-
58149096484
-
-
Camden, J. P.; Dieringer, J. A.; Zhao, J.; Van Duyne, R. P. Acc. Chem. Res. 2008, 41 1653.
-
(2008)
Acc. Chem. Res
, vol.41
, pp. 1653
-
-
Camden, J.P.1
Dieringer, J.A.2
Zhao, J.3
Van Duyne, R.P.4
-
17
-
-
13544258768
-
-
Park. S. K.; Lee, C. K.; Min, K. C; Lee, N. S. Bull. Kor. Chem. Soc. 2004, 25. 1817.
-
(2004)
Bull. Kor. Chem. Soc
, vol.25
, pp. 1817
-
-
Park, S.K.1
Lee, C.K.2
Min, K.C.3
Lee, N.S.4
-
18
-
-
20444398181
-
-
Zhang, D. M.; Xie, Y.; Deb, S. K.; Davison, V. J.; Ben-Amotz, D. Anal. Chem. 2005, 77, 3563.
-
(2005)
Anal. Chem
, vol.77
, pp. 3563
-
-
Zhang, D.M.1
Xie, Y.2
Deb, S.K.3
Davison, V.J.4
Ben-Amotz, D.5
-
23
-
-
67849132061
-
-
In our previous work on R6G, we reported vibrational frequencies that were self-consistent but had a systematic calibration offset of, 11 cm-1
-
In our previous work on R6G, we reported vibrational frequencies that were self-consistent but had a systematic calibration offset of ~ 11 cm-1.
-
-
-
-
26
-
-
15744380793
-
-
Watanabe. H.; Hayazawa, N.; Inouye, Y.; Kawata. S. J. Phys. Chem. B 2005, 109, 5012.
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 5012
-
-
Watanabe, H.1
Hayazawa, N.2
Inouye, Y.3
Kawata, S.4
-
30
-
-
34250803210
-
-
Zhao, J.; Jensen, L.; Sung, J. H.; Zou, S. L.; Schatz, G. C; Van Duyne, R. P. J. Am. Chem. Soc. 2007, 129, 7647.
-
(2007)
J. Am. Chem. Soc
, vol.129
, pp. 7647
-
-
Zhao, J.1
Jensen, L.2
Sung, J.H.3
Zou, S.L.4
Schatz, G.C.5
Van Duyne, R.P.6
-
31
-
-
0001633043
-
Electromagnetic Mechanism of Surface-Enhanced Spectroscopy
-
Chalmers, J. M, Griffiths, P. R, Eds, Wiley: New York
-
Schatz, G. C; Van Duyne, R. P. Electromagnetic Mechanism of Surface-Enhanced Spectroscopy. In Handbook of Vibrational Spectroscopy; Chalmers, J. M., Griffiths, P. R., Eds.; Wiley: New York, 2002; Vol. 1, pp 759.
-
(2002)
Handbook of Vibrational Spectroscopy
, vol.1
, pp. 759
-
-
Schatz, G.C.1
Van Duyne, R.P.2
-
37
-
-
64349090809
-
-
Zhao, J.; Dieringer, J. A.; Zhang, X.; Schatz, G. C; Van Duyne, R. P. J. Phys. Chem. C 2008, 112, 19302.
-
(2008)
J. Phys. Chem. C
, vol.112
, pp. 19302
-
-
Zhao, J.1
Dieringer, J.A.2
Zhang, X.3
Schatz, G.C.4
Van Duyne, R.P.5
-
38
-
-
67849118230
-
-
The structure of the nanoparticle aggregate used in this study was not characterized by correlated high-resolution transmission electron microscopy. However, previous work in ref 13 suggests that the EM enhancement tracks the scattering spectrum
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The structure of the nanoparticle aggregate used in this study was not characterized by correlated high-resolution transmission electron microscopy. However, previous work in ref 13 suggests that the EM enhancement tracks the scattering spectrum.
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