Electrochemical properties of Cr doped V2O5 between 3.8 V and 2.0 V

Solid State Ionics

Volumn 180, Issue 20-22, 2009, Pages 1198-1203

  Zhan, S Y ^a   Wang, C Z ^a   Nikolowski, K ^b   Ehrenberg, H ^b   Chen, G ^a   Wei, Y J ^a  

^a JILIN UNIVERSITY   (China)

^b Institute for Complex Materials   (Germany)

Author keywords

Charge discharge cycling; Cyclic voltammetry; Lithium battery; Potentiostatic intermittent titration technique; Vanadium pentoxide

Indexed keywords

CHARGE-DISCHARGE CYCLING; CR-DOPED; CR-DOPING; DISCHARGE CAPACITIES; DOPED MATERIALS; ELECTROCHEMICAL PERFORMANCE; EX SITU; FIRST CYCLE; GALVANOSTATIC CHARGES; LITHIUM DIFFUSION; METAL-DOPED; OXALIC ACID; POTENTIAL RANGE; POTENTIOSTATIC INTERMITTENT TITRATION TECHNIQUE; POTENTIOSTATIC INTERMITTENT TITRATION TECHNIQUES; SOL-GEL METHODS; VANADIUM PENTOXIDE;

BIOELECTRIC PHENOMENA; CHROMIUM; CRYSTAL STRUCTURE; DIFFRACTION; DOPING (ADDITIVES); ELECTRIC DISCHARGES; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMICAL PROPERTIES; GELATION; LITHIUM; LITHIUM BATTERIES; PHASE TRANSITIONS; SOL-GEL PROCESS; TITRATION; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

CYCLIC VOLTAMMETRY;

EID: 67749084108     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2009.05.020     Document Type: Article

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