Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometry

Nanotechnology

Volumn 20, Issue 30, 2009, Pages

  Ahmed, F ^a   En Naciri, A ^a   Grob, J J ^b   Stchakovsky, M ^c   Johann, L ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

^b Faculté de Médecine   (France)

^c Horiba Jobin Yvon   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; CRITICAL POINTS; DIELECTRIC FUNCTION SPECTRA; DIELECTRIC FUNCTIONS; DISPERSION MODELS; IMPLANTATION ENERGIES; IMPLANTATION TECHNIQUE; MATRIX; OPTICAL RESPONSE; SECOND DERIVATIVES; SELF-ORGANIZED; THERMAL TREATMENT; TWO LAYERS; ZINC IONS;

EQUATIONS OF STATE; ION BOMBARDMENT; ION IMPLANTATION; NANOCRYSTALS; OPTICAL CORRELATION; SEMICONDUCTING ZINC COMPOUNDS; SILICON COMPOUNDS; SILICON OXIDES; SPECTROSCOPIC ELLIPSOMETRY; TELLURIUM; TELLURIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; ZINC;

OPTICAL PROPERTIES;

NANOCRYSTAL; SILICON DIOXIDE; TELLURIUM DERIVATIVE; ZINC DERIVATIVE;

ARTICLE; DIELECTRIC CONSTANT; ELLIPSOMETRY; OPTICAL ROTATION; PARTICLE SIZE; PRIORITY JOURNAL; SPECTROSCOPIC ELLIPSOMETRY; SPECTROSCOPY; SURFACE PROPERTY; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 67651174554     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/30/305702     Document Type: Article

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