Inversion of subsurface properties of layered dielectric structures with random slightly rough interfaces using the method of simulated annealing

IEEE Transactions on Geoscience and Remote Sensing

Volumn 47, Issue 7, 2009, Pages 2035-2046

  Tabatabaeenejad, Alireza ^a   Moghaddam, Mahta ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Global optimization; Inverse problem; Layered media; Random rough surface; Simulated annealing; Subsurface properties

Indexed keywords

ALGORITHM PERFORMANCE; BACKSCATTERING COEFFICIENTS; DIELECTRIC STRUCTURE; FORWARD PROBLEM; GLOBAL OPTIMIZATION METHOD; INVERSION PROBLEMS; INVERSION SCHEME; LAYERED DIELECTRIC STRUCTURE; LAYERED MEDIA; LEAST SQUARE PROBLEMS; LOCAL MINIMUMS; MEASUREMENT NOISE; MODEL PARAMETERS; MULTIPLE POLARIZATIONS; NOISE ANALYSIS; RANDOM ROUGH SURFACE; RETRIEVAL ALGORITHMS; ROUGH BOUNDARY; ROUGH INTERFACES; SMALL PERTURBATION METHOD; SUBSURFACE PROPERTIES; TWO LAYERS;

ANNEALING; BACKSCATTERING; GLOBAL OPTIMIZATION; INVERSE PROBLEMS; PERTURBATION TECHNIQUES; SURFACE MEASUREMENT;

SIMULATED ANNEALING;

ALGORITHM; BACKSCATTER; DIELECTRIC PROPERTY; MEASUREMENT METHOD; OPTIMIZATION; PERFORMANCE ASSESSMENT; PERTURBATION; POLARIZATION; SIMULATED ANNEALING;

EID: 67651158832     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/TGRS.2008.2011982     Document Type: Article

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