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Volumn 46, Issue 2, 2009, Pages 479-490

Comparative study of two phase-field models for grain growth

Author keywords

Grain boundary migration; Grain growth; Microstructure; Model validation; Numerical simulation; Phase field modeling

Indexed keywords

ANALYTICAL THEORY; COMPARATIVE STUDIES; EQUIVALENT MODEL; GRAIN BOUNDARY MIGRATION; GRAIN STRUCTURES; GRAIN-BOUNDARY ENERGY; LARGE-GRAIN; MODEL FORMULATION; MODEL VALIDATION; NUMERICAL SIMULATION; PHASE-FIELD MODELING; PHASE-FIELD MODELS; POLYCRYSTALLINE STRUCTURE; SIMULATION RESULT; TRIPLE JUNCTION; TWO PHASE;

EID: 67651124893     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2009.03.037     Document Type: Article
Times cited : (106)

References (34)
  • 19
    • 0004231024 scopus 로고
    • American Society of Testing Materials, Cleveland pp. 108-110
    • von Neumann J. Metal Interfaces (1952), American Society of Testing Materials, Cleveland pp. 108-110
    • (1952) Metal Interfaces
    • von Neumann, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.