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Journal of Electroceramics

Volumn 21, Issue 1-4 SPEC. ISS., 2008, Pages 8-11

Microwave dielectric loss of thermally stressed MgTiO3 via TEM observation

(3) Yoo, Sun Hi a,b Yoon, Ki Hyun b Choi, Ji Won c

a Korea Institute of Science and Technology Information (KISTI) (South Korea)

b Yonsei University (South Korea)

c Korea Institute of Science and Technology (South Korea)

Author keywords

Cooling rate; Dielectric loss; Dislocation; MgTiO3; Thermal strain

Indexed keywords

AIR QUENCHING; COOLING RATE; COOLING RATES; CRYSTALLOGRAPHIC STRAIN; DISLOCATION; F VALUES; LINE DEFECTS; MGTIO3; MICROWAVE DIELECTRICS; SINTERING TEMPERATURES; TEM; TEM OBSERVATIONS; THERMAL STRAIN;

CERAMIC CAPACITORS; CERAMIC MATERIALS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; MICROWAVES; QUENCHING; SINTERING;

COOLING;

EID: 67651083732 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-007-9073-y Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.