Spatially resolved characterization of the coherence area in the incoherent emission regime of a broad-area vertical-cavity surface-emitting laser

IEEE Journal of Quantum Electronics

Volumn 45, Issue 3, 2009, Pages 249-255

  Verschaffelt, Guy ^a   Craggs, Gordon ^a   Peeters, Michael L F ^a,b   Shyam, K Mandre ^c,d   Thienpont, Hugo ^a   Fischer, Ingo ^a,e  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^d Braun GmbH   (Germany)

^e HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

Semiconductor laser; Spatial coherence; Verticalcavity surface emitting laser (VCSEL)

Indexed keywords

DIRECT MEASUREMENT; EMISSION PROFILE; FAR-FIELD; OUTPUT BEAM; RADIAL TEMPERATURE GRADIENTS; SPATIAL COHERENCE; SPATIALLY RESOLVED; VERTICAL-CAVITY SURFACE EMITTING LASER; VERTICALCAVITY SURFACE-EMITTING LASER (VCSEL);

FIELD EMISSION; LASERS; PULSED LASER APPLICATIONS; PULSED LASERS; SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 67650970864     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2009.2013085     Document Type: Article

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