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Volumn 79, Issue 5, 2009, Pages
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Critical behavior of the contact process in annealed scale-free networks
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT PROCESS;
CRITICAL BEHAVIOR;
CRITICAL SCALING;
DROPLET SIZES;
EVENT DRIVEN;
FINITE-SIZE SCALING THEORY;
NUMERICAL SIMULATION;
RANDOM-WALK PROBLEM;
SCALE FREE NETWORKS;
ANNEALING;
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EID: 67650909315
PISSN: 15393755
EISSN: 15502376
Source Type: Journal
DOI: 10.1103/PhysRevE.79.056115 Document Type: Article |
Times cited : (37)
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References (14)
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