Higher-order photon bunching in a semiconductor microcavity

Science

Volumn 325, Issue 5938, 2009, Pages 297-300

  Assmann M ^a   Veit, F ^a   Bayer, M ^a   Van Der Poel, M ^b   Hvam, J M ^b  

^a TU DORTMUND UNIVERSITY   (Germany)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION; LIGHT INTENSITY; MEASUREMENT METHOD; PARTICLE MOTION; QUANTITATIVE ANALYSIS; QUANTUM MECHANICS; TEMPERATURE EFFECT;

ARTICLE; CORRELATION ANALYSIS; CORRELATION FUNCTION; DEVICE; DISPERSION; FIELD EMISSION; OPTICAL COHERENCE TOMOGRAPHY; PHOTOLUMINESCENCE; PHOTON; PHOTON BUNCHING; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; QUANTUM MECHANICS; SEMICONDUCTOR; SEMICONDUCTOR MICROCAVITY;

EID: 67650812334     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1174488     Document Type: Article

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19. We thank C. B. S0rensen for growing the wafer and I. Akimov for discussions. This work was supported by the Deutsche Forschungsgemeinschaft research group "Quantum optics in semiconductor nanostructures." A patent application for the optical setup presented here is currently being filed.