Interface reconstruction in V-oxide heterostructures determined by x-ray absorption spectroscopy

Applied Physics Letters

Volumn 95, Issue 2, 2009, Pages

  Wadati, H ^a   Hawthorn, D G ^a,b   Geck, J ^a   Regier, T Z ^c   Blyth, R I R ^c   Higuchi, T ^d   Hotta, Y ^d   Hikita, Y ^d   Hwang, H Y ^d,e   Sawatzky, G A ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b UNIVERSITY OF WATERLOO   (Canada)

^c CANADIAN LIGHT SOURCE INC   (Canada)

^d UNIVERSITY OF TOKYO   (Japan)

^e JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL RECONSTRUCTION; INTERFACE RECONSTRUCTION; LAYER THICKNESS; MULTILAYER STRUCTURES; OXIDATION STATE; OXIDE HETEROSTRUCTURES;

ABSORPTION; X RAY ABSORPTION; X RAY SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 67650733451     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3177328     Document Type: Article

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