Effect of surfactant concentration on the stacking modes of organo-silylated layered double hydroxides

Applied Clay Science

Volumn 45, Issue 4, 2009, Pages 262-269

  Tao, Qi ^a,b,c   Yuan, Jie ^d   Frost, Ray L ^b   He, Hongping ^a,b   Yuan, Peng ^a   Zhu, Jianxi ^a  

^a GUANGZHOU INSTITUTE OF GEOCHEMISTRY   (China)

^b QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^d MEDICAL COLLEGE OF JINAN UNIVERSITY   (China)

Author keywords

Anionic surfactant; FTIR; Layered double hydroxides; Silylation; Surface properties; TEM

Indexed keywords

3-AMINOPROPYLTRIETHOXYSILANE; ATR FTIR; ATTENUATED TOTAL REFLECTIONS; DODECYLSULFATE; FTIR; HYDROTALCITES; IDENTICAL STRUCTURES; IN-SITU; INTERLAYER DISTANCE; INTERLAYER WATERS; LAYERED DOUBLE HYDROXIDES; NANO-MATERIALS; OH CONCENTRATION; ORGANIC CONTAMINANT; PLATE EDGES; POTENTIAL APPLICATIONS; SILYLATION; STACKING MODES; SURFACTANT CONCENTRATIONS; TEM; THERMAL PROPERTIES; THERMOGRAVIMETRIC CURVE;

ADSORBENTS; ADSORPTION; ANIONIC SURFACTANTS; BIOPHYSICS; CLAY MINERALS; CONDENSATION REACTIONS; DIFFUSERS (OPTICAL); FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAFTING (CHEMICAL); OXIDES; PRECIPITATION (CHEMICAL); SILANES; SODIUM; THERMODYNAMIC PROPERTIES; TRACE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

SURFACE PROPERTIES;

ANION; CONCENTRATION (COMPOSITION); CONDENSATION; FTIR SPECTROSCOPY; HYDROTALCITE; HYDROXIDE; MORPHOLOGY; SURFACTANT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 67650588770     PISSN: 01691317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.clay.2009.06.007     Document Type: Article

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