Enhanced transmission from a single subwavelength slit aperture surrounded by grooves on a standard detector

Applied Physics Letters

Volumn 95, Issue 1, 2009, Pages

  Dunbar, L A ^a   Guillaume M ^a   De Leon Prez F ^b   Santschi, C ^a   Grenet, E ^a   Eckert, R ^a   Lopez Tejeira F ^b   Garcia Vidal F J ^c   Martin Moreno L ^b   Stanley, R P ^a  

^a CSEM   (Switzerland)

^b UNIVERSITY OF ZARAGOZA   (Spain)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CONSTRUCTIVE INTERFERENCE; ENHANCED TRANSMISSION; GOLD LAYER; INCIDENT LIGHT; MODAL EXPANSION METHOD; POST PROCESS; SINGLE SLIT; STANDARD CMOS PROCESS; STANDARD DETECTORS; SUBWAVELENGTH SLITS; SUBWAVELENGTH WIDTH;

METALLIC COMPOUNDS; MOS DEVICES; SIGNAL TO NOISE RATIO; STANDARDS; SURFACE WAVES;

ELECTROMAGNETIC WAVE TRANSMISSION;

EID: 67650504964     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3160544     Document Type: Article

References (15)

1. T. W. Ebbesen, H. J. Lezec, H. F. Ghaemi, T. Thio, and P. A. Wolff, Nature (London) 0028-0836 391, 667 (1998). 10.1038/35570
2. D. E. Grupp, H. J. Lezec, T. Thio, and T. W. Ebbesen, Adv. Mater. (Weinheim, Ger.) 0935-9648 11, 860 (1999). 10.1002/(SICI)1521-4095(199907)11: 10<860::AID-ADMA860>3.0.CO;2-V
3. F. J. García-Vidal, H. J. Lezec, T. W. Ebbesen, and L. Martín-Moreno, Phys. Rev. Lett. 0031-9007 90, 213901 (2003). 10.1103/PhysRevLett.90.213901
4. A. Degiron and T. W. Ebbesen, Opt. Express 1094-4087 12, 3694 (2004). 10.1364/OPEX.12.003694
5. O. T. A. Janssen, H. P. Urback, and G. W. t Hooft, Phys. Rev. Lett. 0031-9007 99, 043902 (2007), and reference therein. 10.1103/PhysRevLett.99. 043902
6. T. Ishi, J. Fujikata, K. Makita, T. Baba, and K. Ohashi, Jpn. J. Appl. Phys., Part 2 0021-4922 44, L364 (2005). 10.1143/JJAP.44.L364
7. R. D. R. Bhat, N. C. Panoiu, S. T. J. Brueck, and R. M. Osgood, Jr., Opt. Express 1094-4087 16, 4588 (2008). 10.1364/OE.16.004588
8. Z. Yu, G. Veronis, S. Fan, and M. Brongersma, Appl. Phys. Lett. 0003-6951 89, 151116 (2006). 10.1063/1.2360896
9. J. Daugman, IEEE Trans. Circuits Syst. Video Technol. 1051-8215 14, 21 (2004). 10.1109/TCSVT.2003.818350
10. P. -F. Rüedi, P. Heim, F. Kaess, E. Grenet, F. Heitger, P. -Y. Burgi, S. Gyger, and P. Nussbaum, IEEE J. Solid-State Circuits 0018-9200 38, 2325 (2003). 10.1109/JSSC.2003.819169
11. A. Hoffmann, Z. Lenkefi, and Z. Szentirmay, J. Phys.: Condens. Matter 0953-8984 10, 5503 (1998). 10.1088/0953-8984/10/24/025
12. F. López-Tejeira, F. J. García-Vidal, and L. Martín-Moreno, Phys. Rev. B 0163-1829 72, 161405 (2005). 10.1103/PhysRevB.72.161405
13. F. de León-Ṕrez, G. Brucoli, F. J. García-Vidal, and L. Martín-Moreno, New J. Phys. 1367-2630 10, 105017 (2008). 10.1088/1367-2630/10/10/105017
14. Note integration was over a fixed period of time to a fixed voltage. This prevents saturation and gives a large dynamical range. However, the noises scales inversely proportional to signal. This is particularly apparent on Fig..
15. E. Laux, C. Genet, T. Skauli, and T. W. Ebbesen, Nat. Photonics 1749-4885 2, 161 (2008). 10.1038/nphoton.2008.1