메뉴 건너뛰기




Volumn 95, Issue 1, 2009, Pages

Size-dependent thermopower in nanocrystalline nickel

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE PARTICLE SIZE; LOW TEMPERATURES; NANO-CRYSTALLINE NICKEL; NANOCRYSTALLINE; PHONON CONFINEMENT; PHONON DRAG; SIGN-CHANGE; SUPERPARAMAGNETIC TRANSITION; THERMOPOWER;

EID: 67650504693     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3167302     Document Type: Article
Times cited : (23)

References (22)
  • 1
    • 35748939702 scopus 로고    scopus 로고
    • 0957-4484,. 10.1088/0957-4484/18/48/485703
    • E. Shapira, A. Tsukernik, and Y. Selzer, Nanotechnology 0957-4484 18, 485703 (2007). 10.1088/0957-4484/18/48/485703
    • (2007) Nanotechnology , vol.18 , pp. 485703
    • Shapira, E.1    Tsukernik, A.2    Selzer, Y.3
  • 2
    • 42549125613 scopus 로고    scopus 로고
    • 0957-4484,. 10.1088/0957-4484/19/18/185711
    • G. S. Okram, A. Soni, and R. Rawat, Nanotechnology 0957-4484 19, 185711 (2008). 10.1088/0957-4484/19/18/185711
    • (2008) Nanotechnology , vol.19 , pp. 185711
    • Okram, G.S.1    Soni, A.2    Rawat, R.3
  • 5
  • 8
    • 27344438474 scopus 로고
    • 0096-8250, () 10.1103/PhysRev.140.A1834;, Phys. Rev. B 0556-2805 12, 3991 (1975) 10.1103/PhysRevB.12.3991;, J. Appl. Phys. 41, 1868 (1970). 10.1063/1.1659124
    • R. P. Huebener, Phys. Rev. 0096-8250 140, A1834 (1965) 10.1103/PhysRev.140.A1834; R. F. Moreland and R. R. Bourassa, Phys. Rev. B 0556-2805 12, 3991 (1975) 10.1103/PhysRevB.12.3991; W. F. Leonard and S. F. Lin, J. Appl. Phys. 41, 1868 (1970). 10.1063/1.1659124
    • (1965) Phys. Rev. , vol.140 , pp. 1834
    • Huebener, R.P.1    Moreland, R.F.2    Bourassa, R.R.3    Leonard, W.F.4    Lin, S.F.5
  • 9
    • 77956957276 scopus 로고    scopus 로고
    • in, edited by H. Ehrenreich and F. Spaepen (Academic, USA), Vol.,.
    • G. D. Mahan, in Solid State Physics, edited by, H. Ehrenreich, and, F. Spaepen, (Academic, USA, 1998), Vol. 51, p. 81.
    • (1998) Solid State Physics , vol.51 , pp. 81
    • Mahan, G.D.1
  • 11
    • 0001173915 scopus 로고
    • 0163-1829, () 10.1103/PhysRevB.47.12727;, Phys. Rev. B 0163-1829 68, 075304 (2003). 10.1103/PhysRevB.68.075304
    • L. D. Hicks and M. S. Dresselhaus, Phys. Rev. B 0163-1829 47, 12727 (1993) 10.1103/PhysRevB.47.12727; Y. -M. Lin and M. S. Dresselhaus, Phys. Rev. B 0163-1829 68, 075304 (2003). 10.1103/PhysRevB.68.075304
    • (1993) Phys. Rev. B , vol.47 , pp. 12727
    • Hicks, L.D.1    Dresselhaus, M.S.2    Lin, Y.-M.3    Dresselhaus, M.S.4
  • 12
    • 18144397257 scopus 로고    scopus 로고
    • 0031-9007,. 10.1103/PhysRevLett.94.096601
    • T. E. Humphrey and H. Linke, Phys. Rev. Lett. 0031-9007 94, 096601 (2005). 10.1103/PhysRevLett.94.096601
    • (2005) Phys. Rev. Lett. , vol.94 , pp. 096601
    • Humphrey, T.E.1    Linke, H.2
  • 13
    • 0001029438 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.368928
    • A. Balandin and K. L. Wang, J. Appl. Phys. 0021-8979 84, 6149 (1998). 10.1063/1.368928
    • (1998) J. Appl. Phys. , vol.84 , pp. 6149
    • Balandin, A.1    Wang, K.L.2
  • 15
    • 58149263725 scopus 로고    scopus 로고
    • 0034-6748,. 10.1063/1.3048545
    • A. Soni and G. S. Okram, Rev. Sci. Instrum. 0034-6748 79, 125103 (2008). 10.1063/1.3048545
    • (2008) Rev. Sci. Instrum. , vol.79 , pp. 125103
    • Soni, A.1    Okram, G.S.2
  • 17
    • 0014704881 scopus 로고
    • 10.1088/0022-3719/3/1/016
    • T. Farrell and D. Greig, J. Phys. C 3, 138 (1970). 10.1088/0022-3719/3/1/ 016
    • (1970) J. Phys. C , vol.3 , pp. 138
    • Farrell, T.1    Greig, D.2
  • 18
    • 67650349519 scopus 로고    scopus 로고
    • Based on another sample of 25nm (XRD) and ∼14 nm (TEM), present sample size of 38nm (XRD) might well be ∼30 nm (TEM) that in turn matches that in Ref.. TEM data normally show lower value because of wide distribution of particle size in which number of bigger particles is small; yet their volume fraction is large (∼82%), which is measured by XRD.
    • Based on another sample of 25nm (XRD) and ∼14 nm (TEM), present sample size of 38nm (XRD) might well be ∼30 nm (TEM) that in turn matches that in Ref.. TEM data normally show lower value because of wide distribution of particle size in which number of bigger particles is small; yet their volume fraction is large (∼82%), which is measured by XRD.
  • 19
    • 0014362932 scopus 로고
    • 0022-3719,. 10.1088/0022-3719/1/5/326
    • T. Farrell and D. Greig, J. Phys. C 0022-3719 1, 1359 (1968). 10.1088/0022-3719/1/5/326
    • (1968) J. Phys. C , vol.1 , pp. 1359
    • Farrell, T.1    Greig, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.