SCRAP: Sequential circuits reliability analysis program

Microelectronics Reliability

Volumn 49, Issue 8, 2009, Pages 924-933

  Seyyed Mahdavi, S J ^a   Mohammadi, K ^a  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; FAILURE PROBABILITY; FAILURE RATE; FLIGHT CONTROL; INTEGRAL PART; LIFE-CRITICAL APPLICATIONS; RAPID GROWTH; STANDARD CELL; SYSTEM DESIGN PROCESS; TOOLS AND TECHNIQUES;

AIRCRAFT; CELL MEMBRANES; DIGITAL INTEGRATED CIRCUITS; ELECTRIC BATTERIES; ELECTRIC NETWORK ANALYSIS; FLIGHT CONTROL SYSTEMS; PROGRAM PROCESSORS; QUALITY ASSURANCE; SEQUENTIAL CIRCUITS; SEQUENTIAL SWITCHING; SYSTEMS ANALYSIS;

RELIABILITY ANALYSIS;

EID: 67650495198     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.06.001     Document Type: Article

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