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Volumn 48, Issue 3, 2009, Pages 306-310

On graphically checking goodness-of-fit of binary logistic regression models

Author keywords

Nonlinear models; Residuals

Indexed keywords

ARTICLE; INFORMATION PROCESSING; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL;

EID: 67650478018     PISSN: 00261270     EISSN: None     Source Type: Journal    
DOI: 10.3414/ME0571     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.