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Volumn 11, Issue , 2009, Pages

Probing a composite spin-boson environment

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION MEASUREMENT; DECOHERENCE; FLUCTUATORS; GATE OPERATION; HARMFUL EFFECTS; LINDBLAD; MASTER EQUATIONS; MEDIATED INTERACTION; PREPARATION TECHNIQUE; PROBE SYSTEMS; QUANTUM COMPUTATION; QUANTUM CORRELATIONS; QUBIT STATE; QUBIT SYSTEM;

EID: 67650459451     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/6/063028     Document Type: Article
Times cited : (17)

References (36)
  • 1
    • 67650475579 scopus 로고    scopus 로고
    • Devoret M H, Wallraff A and Martinis J M 2004 Superconducting qubits: a short review arXiv:condmat/0411174
    • Devoret M H, Wallraff A and Martinis J M 2004 Superconducting qubits: a short review arXiv:condmat/0411174
  • 7
    • 67650493767 scopus 로고    scopus 로고
    • Lupaşcu A, Bertet P, Driessen E F C, Harmans C J P M and Mooij J E 2008 One- and two-photon spectroscopy of a flux qubit coupled to a microscopic defect arXiv:0810.0590
    • Lupaşcu A, Bertet P, Driessen E F C, Harmans C J P M and Mooij J E 2008 One- and two-photon spectroscopy of a flux qubit coupled to a microscopic defect arXiv:0810.0590
  • 9
    • 33644885030 scopus 로고    scopus 로고
    • Galperin Y M, Altshuler B L, Bergli J and Shantsev D V 2006 Phys. Rev. Lett. 96 097009 (arXiv:condmat/0312490)
    • Galperin Y M, Altshuler B L, Bergli J and Shantsev D V 2006 Phys. Rev. Lett. 96 097009 (arXiv:condmat/0312490)
  • 18
    • 0042825257 scopus 로고    scopus 로고
    • Schoelkopf R J, Clerk A A, Girvin S M, Lehnert K W and Devoret M H 2003 Noise and measurement backaction in superconducting circuits: qubits as spectrometers of quantum noise Noise and Information in Nanoelectronics, Sensors and Standards (Proc. SPIE 5115) ed L B Kish et al (Bellingham, WA, USA) pp 356-76
    • Schoelkopf R J, Clerk A A, Girvin S M, Lehnert K W and Devoret M H 2003 Noise and measurement backaction in superconducting circuits: qubits as spectrometers of quantum noise Noise and Information in Nanoelectronics, Sensors and Standards (Proc. SPIE vol 5115) ed L B Kish et al (Bellingham, WA, USA) pp 356-76
  • 35
    • 67650505820 scopus 로고    scopus 로고
    • Rivas A, Oxtoby N P, Huelga S F, Plenio M B and Fazio R unpublished
    • Rivas A, Oxtoby N P, Huelga S F, Plenio M B and Fazio R unpublished


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.