SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 96, Issue 2, 2009, Pages 511-514

Development of a Seebeck coefficient Standard Reference Material

(9) Lowhorn, Nathan D a Wong Ng, W a Lu, Z Q a Thomas, E a Otani, M a Green, M a Dilley, N b Sharp, J c Tran, T N d

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b Quantum Design Inc (United States)

c Marlow Industries Inc (United States)

d NAVAL SURFACE WARFARE CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ANALYSIS; DATA COMPARISONS; INSTRUMENT CALIBRATIONS; MEASUREMENT ACCURACY; MEASUREMENT TECHNIQUES; STANDARD REFERENCE MATERIAL; THERMOELECTRIC MATERIAL;

RELUCTANCE MOTORS; STANDARDIZATION; TELLURIUM COMPOUNDS;

SEEBECK COEFFICIENT;

EID: 67650447973 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-009-5191-5 Document Type: Article

Times cited : (42)

References (7)

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- T.M. Tritt, M.A. Subramanian (eds.) Materials Research Soc.
- T.M. Tritt, M.A. Subramanian (eds.), Thermoelectric Materials, Phenomena, and Applications: A Bird's Eye View, Harvesting Energy through Thermoelectrics: Power Generation and Cooling. MRS Bulletin, Materials Research Soc. (2006), pp. 188-195
- (2006) MRS Bulletin , pp. 188-195

2
- 0003396575
- Springer New York
- G.S. Nolas, Thermoelectrics: Basic Principles and New Materials Developments (Springer, New York, 2001)
- (2001) Thermoelectrics: Basic Principles and New Materials Developments
- Nolas, G.S.¹

3
- 0003550314
- NIST Standard Reference Materials Home Page. http://ts.nist.gov/ts/ htdocs/230/232/232.htm
- NIST Standard Reference Materials Home Page

4
- 57249097169
- N.D. Lowhorn W. Wong-Ng Z.Q.J. Lu W. Zhang E. Thomas M. Otani M. Green T.N. Tran C. Caylor N. Dilley A. Downey B. Edwards N. Elsner S. Ghamaty T. Hogan Q. Jie Q. Li J. Martin G. Nolas H. Obara J. Sharp R. Venkatasubramanian R. Willigan J. Yang T. Tritt 2009 Appl. Phys. A 94 231 234
- (2009) Appl. Phys. A , vol.94 , pp. 231-234
- Lowhorn, N.D.¹ Wong-Ng, W.² Lu, Z.Q.J.³ Zhang, W.⁴ Thomas, E.⁵ Otani, M.⁶ Green, M.⁷ Tran, T.N.⁸ Caylor, C.⁹ Dilley, N.¹⁰ Downey, A.¹¹ Edwards, B.¹² Elsner, N.¹³ Ghamaty, S.¹⁴ Hogan, T.¹⁵ Jie, Q.¹⁶ Li, Q.¹⁷ Martin, J.¹⁸ Nolas, G.¹⁹ Obara, H.²⁰ more..

5
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- Z.Q.J. Lu N.D. Lowhorn W. Wong-Ng W. Zhang E. Thomas M. Otani M. Green T.N. Tran C. Caylor N. Dilley A. Downey B. Edwards N. Elsner S. Ghamaty T. Hogan Q. Jie Q. Li J. Martin G. Nolas H. Obara J. Sharp R. Venkatasubramanian R. Willigan J. Yang T. Tritt 2009 J. Res. Natl. Inst. Stand. Tech. 114 1 37 55
- (2009) J. Res. Natl. Inst. Stand. Tech. , vol.114 , Issue.1 , pp. 37-55
- Lu, Z.Q.J.¹ Lowhorn, N.D.² Wong-Ng, W.³ Zhang, W.⁴ Thomas, E.⁵ Otani, M.⁶ Green, M.⁷ Tran, T.N.⁸ Caylor, C.⁹ Dilley, N.¹⁰ Downey, A.¹¹ Edwards, B.¹² Elsner, N.¹³ Ghamaty, S.¹⁴ Hogan, T.¹⁵ Jie, Q.¹⁶ Li, Q.¹⁷ Martin, J.¹⁸ Nolas, G.¹⁹ Obara, H.²⁰ more..

6
- 67650358404
- to be submitted
- N.D. Lowhorn, W. Wong-Ng, Z.Q. Lu, E. Thomas, M. Otani, M. Green, N. Dilley, J. Sharp, T.N. Tran, J. Res. Natl. Inst. Stand. Tech. (2008 to be submitted)
- (2008) J. Res. Natl. Inst. Stand. Tech.
- N.D. Lowhorn¹ W. Wong-Ng² Z.Q. Lu³ E. Thomas⁴ M. Otani⁵ M. Green⁶ N. Dilley⁷ J. Sharp⁸ T.N. Tran⁹

7
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- NIST website on Hall effect measurements. http://www.eeel.nist.gov/812/ hall.html
- NIST website on Hall Effect Measurements

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.