X-ray diffraction and Raman spectroscopic study of clinopyroxenes with six-coordinated Si in the Na(Mg0.5Si0.5)Si 2O6-NaAlSi2O6 system

American Mineralogist

Volumn 94, Issue 7, 2009, Pages 942-949

  Yang, Hexiong ^a   Konzett, Jürgen ^b   Frost, Daniel J ^c   Downs, Robert T ^a  

^a University of Arizona   (United States)

^b UNIVERSITY OF INNSBRUCK   (Austria)

^c UNIVERSITÄT BAYREUTH   (Germany)

Author keywords

Clinopyroxenes; Phase transformation; Raman spectroscopy; Six coordinated silicon; X ray structure refinement

Indexed keywords

ALUMINUM COMPOUNDS; IODINE COMPOUNDS; MAGNESIUM COMPOUNDS; PHASE TRANSITIONS; PHOSPHORUS COMPOUNDS; RAMAN SPECTROSCOPY; SILICATE MINERALS; SILICON WAFERS; SINGLE CRYSTALS; SODIUM COMPOUNDS; SODIUM METALLOGRAPHY; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION;

CLINOPYROXENES; OCTAHEDRAL SITES; RAMAN SPECTROSCOPIC STUDY; SINGLE CRYSTAL X-RAY DIFFRACTION; SIX-COORDINATED SILICON; STRUCTURAL VARIATIONS; UNIT CELL PARAMETERS; X-RAY STRUCTURE;

VANADIUM COMPOUNDS;

CLINOPYROXENE; CRYSTALLIZATION; DIOPSIDE; JADEITE; PHASE TRANSITION; RAMAN SPECTROSCOPY; X-RAY DIFFRACTION;

EID: 67650340668     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2009.3084     Document Type: Article

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