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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 27, Issue 4, 2009, Pages 1029-1034

Reflectance anisotropy spectroscopy: A probe to explore organic epitaxial growth

(11) Bussetti, G a Cirilli, S a Violante, A a Chiostri, V a Goletti, C a Chiaradia, P a Sassella, A b Campione, M b Raimondo, L b Braga, D b Borghesi, A b

a UNIVERSITY OF ROME TOR VERGATA (Italy)

b UNIVERSITY OF MILANO BICOCCA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITY; EPITAXIAL RELATIONS; EX SITU; HETEROEPITAXY; HIGH SENSITIVITY; HOMOEPITAXY; IN-SITU; ORGANIC MOLECULAR BEAM EPITAXY; QUATERTHIOPHENE; REFLECTANCE ANISOTROPY SPECTROSCOPY;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; EPITAXIAL FILMS; EPITAXIAL LAYERS; HETEROJUNCTION BIPOLAR TRANSISTORS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; MONOLAYERS; OPTICAL MICROSCOPY; REFLECTION; VACUUM; VACUUM DEPOSITION;

EPITAXIAL GROWTH;

EID: 67650281233 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.3155399 Document Type: Article

Times cited : (18)

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