Metric adaptation for supervised attribute rating

ESANN 2008 Proceedings, 16th European Symposium on Artificial Neural Networks - Advances in Computational Intelligence and Learning

Volumn , Issue , 2008, Pages 31-36

  Strickert, M ^a   Schleif, F M ^b   Villmann, T ^b  

^a LEIBNIZ INSTITUTE OF PLANT GENETICS AND CROP PLANT RESEARCH IPK   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Adaptive measures; Supervised feature characterization

Indexed keywords

ADAPTIVE MEASURES; ATTRIBUTE WEIGHT; CLASS INFORMATION; DATA SIMILARITY; FEATURE CHARACTERIZATION; METRIC ADAPTATION; MINKOWSKI METRICS; NEW APPROACHES;

MASS SPECTROMETRY; NEURAL NETWORKS;

METADATA;

EID: 67650240860     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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