Microstructural aspects for defect emission and E2 high phonon mode of ZnO thin films

Journal of Applied Physics

Volumn 105, Issue 12, 2009, Pages

  Ghosh, Avijit ^a   Choudhary, R N P ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; ANHARMONIC; ANNEALING TEMPERATURES; CARBON MATRIX; DEFECT EMISSION; DEFECT STATE; GRAZING INCIDENCE X-RAY DIFFRACTION; GREEN EMISSIONS; HIGH FREQUENCY; LINEWIDTH BROADENING; MICROSTRUCTURAL ANALYSIS; MICROSTRUCTURAL ASPECTS; OXIDATION TEMPERATURE; PHONON FREQUENCIES; PHONON MODE; RAMAN SCATTERING SPECTROSCOPY; ROOM TEMPERATURE; SPECTROSCOPIC PROPERTY; THERMAL OXIDATION; VIOLET EMISSION; ZNO THIN FILM;

DEFECTS; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; METALLIC FILMS; OPTICAL FILMS; OXIDATION; PHONONS; RIETVELD ANALYSIS; RIETVELD METHOD; SEMICONDUCTING ZINC COMPOUNDS; THIN FILMS; ZINC; ZINC OXIDE;

CARBON FILMS;

EID: 67650218134     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3149786     Document Type: Conference Paper

References (35)

1. B. C. Lee, K. W. Kim, M. A. Strroscio, and M. Dutta, Phys. Rev. B 0163-1829 58, 4860 (1998). 10.1103/PhysRevB.58.4860
2. D. C. Reynolds, D. C. Look, B. Jobai, C. W. Litton, T. C. Collins, W. Harsch, and G. Cantwell, Phys. Rev. B 0163-1829 57, 12151 (1998). 10.1103/PhysRevB.57.12151
3. V. A. Fonoberov and A. A. Balandin, Appl. Phys. Lett. 0003-6951 85, 5971 (2004). 10.1063/1.1835992
4. A. F. Kohan, G. Ceder, D. Morgan, and C. G. Van de Walle, Phys. Rev. B 0163-1829 61, 15019 (2000). 10.1103/PhysRevB.61.15019
5. S. B. Zhang, S. H. Wei, and A. Zunger, Phys. Rev. B 0163-1829 63, 075205 (2001). 10.1103/PhysRevB.63.075205
6. T. C. Damen, S. P. S. Porto, and B. Tell, Phys. Rev. 142, 570 (1966). 10.1103/PhysRev.142.570
7. A. Ghosh and R. N. P. Choudhary, Phys. Status Solidi A 0031-8965 206, 535 (2009). 10.1002/pssa.200824407
8. L. Lutterotti and P. Scardi, J. Appl. Crystallogr. 0021-8898 23, 246 (1990). 10.1107/S0021889890002382
9. G. Caglioti, A. Paoletti, and F. P. Ricci, Nucl. Instrum. 3, 223 (1958). 10.1016/0369-643X(58)90029-X
10. B. E. Warren, X-Ray Diffraction (Addison-Wesley, Reading, MA, 1969), pp. 304.
11. A. Ghosh and R. N. P. Choudhary, Philos. Mag. B (unpublished).
12. G. K. Williamson and R. E. Smallman, Philos. Mag. 1, 34 (1956). 10.1080/14786435608238074
13. P. Chatterjee and S. P. Sengupta, Philos. Mag. A 0141-8610 81, 49 (2001). 10.1080/01418610108216617
14. P. Mukherjee, A. Sakar, P. Barat, S. K. Bandyopadhyay, P. Sen, S. K. Chattopadhyay, P. Chatterjee, S. K. Chatterjee, and M. K. Mitra, Acta Mater. 1359-6454 52, 5687 (2004). 10.1016/j.actamat.2004.08.030
15. T. Moe Børseth, B. G. Svensson, A. Yu. Kuznetsov, P. Klason, Q. X. Zhao, and M. Willander, Appl. Phys. Lett. 0003-6951 89, 262112 (2006). 10.1063/1.2424641
16. F. Tuomisto, K. Saarinen, D. C. Look, and G. C. Farlow, Phys. Rev. B 0163-1829 72, 085206 (2005). 10.1103/PhysRevB.72.085206
17. Outokumpu HSC CHEMISTRY for Windows program, Version 4.1, Outokumpu Research Oy, Pori, Finland.
18. Phosphor Handbook, edited by, S. Shionoya, and, W. M. Yen, (Chemical Rubber, Cleveland, 1999).
19. T. Koida, S. F. Chichibu, A. Uedono, A. Tsukazaki, M. Kawasaki, T. Sota, Y. Segawa, and H. Koinuma, Appl. Phys. Lett. 82, 532 (2003). 10.1063/1.1540220
20. V. A. Coleman, J. E. Brabley, C. Jagdish, and M. R. Philips, Appl. Phys. Lett. 0003-6951 89, 082102 (2006). 10.1063/1.2338552
21. Y. C. Kong, D. P. Yu, B. Zhang, W. Fang, and S. Q. Feng, Appl. Phys. Lett. 0003-6951 78, 407 (2001). 10.1063/1.1342050
22. H. Zeng, P. Liu, W. Cai, X. Cai, and S. Yang, Cryst. Growth Des. 1528-7483 7, 1092 (2007). 10.1021/cg0607147
23. V. A. Fonoberov, K. A. Alim, A. A. Balandin, F. Xiu, and J. Liu, Phys. Rev. B 0163-1829 73, 165317 (2006). 10.1103/PhysRevB.73.165317
24. T. Matsumoto, H. Kato, K. Miyamoto, M. Sano, and E. A. Zhukov, Appl. Phys. Lett. 0003-6951 81, 1231 (2002). 10.1063/1.1499991
25. H. Zeng, W. Cai, J. Hu, G. Dua, P. Liu, and Y. Li, Appl. Phys. Lett. 0003-6951 88, 171910 (2006). 10.1063/1.2196051
26. Z. Q. Chen, M. Maekawa, A. Kawasuso, S. Sakai, and H. Naramoto, J. Appl. Phys. 0021-8979 99, 093507 (2006). 10.1063/1.2194113
27. P. S. Xu, Y. M. Sun, C. S. Shi, F. Q. Xu, and H. B. Pan, Nucl. Instrum. Methods Phys. Res. B 0168-583X 199, 286 (2003). 10.1016/S0168-583X(02)01425-8
28. Y. Zou, Y. Wang, Z. Chen, J. Wang, and Y. Li, Mater. Lett. 0167-577X 59, 3042 (2005). 10.1016/j.matlet.2005.05.015
29. K. A. Alim, V. A. Fonoberov, and A. A. Balandin, Appl. Phys. Lett. 0003-6951 86, 053103 (2005). 10.1063/1.1861509
30. G. T. Du, Y. Ma, Y. T. Zhang, and T. P. Yang, Appl. Phys. Lett. 0003-6951 87, 213103 (2005). 10.1063/1.2132528
31. K. A. Alim, V. A. Fonoberov, M. Shamsa, and A. A. Balandin, J. Appl. Phys. 0021-8979 97, 124313 (2005). 10.1063/1.1944222
32. K. Samanta, P. Bhattacharya, and R. S. Katiyar, Phys. Rev. B 0163-1829 75, 035208 (2007). 10.1103/PhysRevB.75.035208
33. J. Menendez and M. Cardona, Phys. Rev. B 0163-1829 29, 2051 (1984). 10.1103/PhysRevB.29.2051
34. F. Widulle, T. Ruf, A. Göbel, E. Schönherr, and M. Cardona, Phys. Rev. Lett. 0031-9007 82, 5281 (1999). 10.1103/PhysRevLett.82.5281
35. J. Serrano, F. J. Manjón, A. H. Romero, F. Widulle, R. Lauck, and M. Cardona, Phys. Rev. Lett. 0031-9007 90, 055510 (2003). 10.1103/PhysRevLett. 90.055510