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Volumn 404, Issue 16, 2009, Pages 2225-2228

Determination of trap depth and trap density in Se70Te30-xZnx thin films using thermally stimulated current measurements

Author keywords

Chalcogenide glasses; Thermally stimulated currents; Trap depth and trap density

Indexed keywords

CHALCOGENIDE GLASSES; CONCENTRATION OF; HIGHER TEMPERATURES; THERMALLY STIMULATED CURRENT; THERMALLY STIMULATED CURRENTS; TRAP DENSITY; TRAP DEPTH; TRAP DEPTH AND TRAP DENSITY;

EID: 67650101256     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.04.015     Document Type: Article
Times cited : (17)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.