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Volumn 404, Issue 16, 2009, Pages 2225-2228
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Determination of trap depth and trap density in Se70Te30-xZnx thin films using thermally stimulated current measurements
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Author keywords
Chalcogenide glasses; Thermally stimulated currents; Trap depth and trap density
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Indexed keywords
CHALCOGENIDE GLASSES;
CONCENTRATION OF;
HIGHER TEMPERATURES;
THERMALLY STIMULATED CURRENT;
THERMALLY STIMULATED CURRENTS;
TRAP DENSITY;
TRAP DEPTH;
TRAP DEPTH AND TRAP DENSITY;
ELECTRIC CURRENT MEASUREMENT;
GLASS;
HEATING;
HEATING RATE;
SEMICONDUCTING SELENIUM COMPOUNDS;
TELLURIUM COMPOUNDS;
THIN FILMS;
ZINC;
THERMOLUMINESCENCE;
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EID: 67650101256
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.04.015 Document Type: Article |
Times cited : (17)
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References (22)
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