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Volumn 24, Issue 3, 2009, Pages 544-556

A new line symmetry distance and its application to data clustering

Author keywords

Clustering; Face recognition; Genetic algorithm; Kd tree; Line symmetry based distance; Symmetry property; Unsupervised classification

Indexed keywords

CLUSTERING; KD-TREE; LINE-SYMMETRY-BASED DISTANCE; SYMMETRY PROPERTY; UNSUPERVISED CLASSIFICATION;

EID: 67649959399     PISSN: 10009000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11390-009-9244-1     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.