Electrochemical and photoelectrochemical characterization of CuFeO 2 single crystal

Journal of Solid State Electrochemistry

Volumn 13, Issue 9, 2009, Pages 1395-1401

  Omeiri, S ^a,b   Bellal, B ^a   Bouguelia, A ^a   Bessekhouad, Y ^a   Trari, M ^a  

^a UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE   (Algeria)

^b Technical and Scientific Research Center of Physical Analysis   (Algeria)

Author keywords

CuFeO 2; Electrochemical impedance spectroscopy; Photoelectrochemical; Semiconductor; Single crystal

Indexed keywords

A-DENSITY; CAPACITIVE BEHAVIOR; CONSTANT PHASE ELEMENT; CUFEO 2; D ORBITALS; DELAFOSSITE OXIDES; DELAFOSSITE STRUCTURE; ELECTRICAL EQUIVALENT CIRCUIT; ELECTROCHEMICAL STUDIES; EXCHANGE CURRENT DENSITIES; FLAT BAND POTENTIAL; FLUX METHODS; LAYERED LATTICES; LINEAR BEHAVIOR; LOW DENSITY; NARROW BAND GAP; NYQUIST PLOTS; OXYGEN INSERTION; OXYGEN INTERCALATION; P-TYPE CONDUCTIVITY; PHOTOELECTROCHEMICAL; PHOTOELECTROCHEMICAL CHARACTERIZATION; SEMI-LOGARITHMIC PLOTS; SEMICONDUCTOR; SURFACE STATE;

CAPACITANCE MEASUREMENT; CHEMICAL STABILITY; COPPER COMPOUNDS; CRYSTAL STRUCTURE; ELECTROCHEMICAL CORROSION; ELECTROLYTES; MOSFET DEVICES; OXYGEN; SINGLE CRYSTALS;

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

EID: 67649887902     PISSN: 14328488     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10008-008-0703-3     Document Type: Article

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