2,5-Bis(bromo-meth-yl)biphen-yl

Acta Crystallographica Section E: Structure Reports Online

Volumn 65, Issue 6, 2009, Pages

  Kuś, Piotr ^a   Zemanek, Aleksander ^a   Jones, Peter G ^b  

^a UNIVERSITY OF SILESIA   (Poland)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67649873022     PISSN: 16005368     EISSN: 16005368     Source Type: Journal    
DOI: 10.1107/S1600536809018066     Document Type: Article

References (9)

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3. Du Mont, W.-W., Bätcher, M., Daniliuc, C., Devillanova, F. A., Druckenbrodt, C., Jeske, J., Jones, P. G., Lippolis, V., Ruthe, F. &Seppälä, E. (2008). Eur. J. Inorg. Chem. pp. 4562-4577.
4. Jones, P. G. &Kuś, P. (2005). Acta Cryst. E61, o2947-o2948.
5. Jones, P. G. &Kuś, P. (2007). Z. Naturforsch. Teil B, 62, 725-731.
6. Jones, P. G., Zemanek, A. &Kuś, P. (2007). Acta Cryst. C63, o73-o76.
7. Obrey, S. J., Bott, S. G. &Barron, A. R. (2002). J. Chem. Crystallogr. 32, 205-207.
8. Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.
9. Siemens (1994). XP. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.