메뉴 건너뛰기




Volumn 58, Issue 7, 2009, Pages 865-877

Process variation-aware adaptive cache architecture and management

Author keywords

Address prediction; Cache; Process variation; Superscalar processors

Indexed keywords

ACCESS LATENCY; ADDRESS PREDICTION; CACHE; CACHE ACCESS; CACHE ARCHITECTURE; CACHE MANAGEMENT POLICIES; CRITICAL PROCESS PARAMETERS; DESIGN METHODOLOGY; FUTURE DESIGNS; HARDWARE COMPONENTS; MEMORY COMPONENT; MINIMUM-SIZED TRANSISTORS; NONUNIFORM; ON-CHIP DATA CACHE; PROCESS VARIATION; SUPERSCALAR PROCESSORS; WORST CASE DESIGN; WORST CASE SCENARIO;

EID: 67649855147     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2009.30     Document Type: Article
Times cited : (20)

References (40)
  • 1
    • 67649882460 scopus 로고    scopus 로고
    • http://www.eas.asu.edu/~ptm/, 2009.
    • (2009)
  • 4
    • 25144518593 scopus 로고    scopus 로고
    • Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture
    • Sept
    • A. Agarwal et al., "Process Variation in Embedded Memories: Failure Analysis and Variation Aware Architecture," IEEE J. Solid-State Circuits, vol. 40, no. 9, pp. 1804-1814, Sept. 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , Issue.9 , pp. 1804-1814
    • Agarwal, A.1
  • 7
    • 0041633858 scopus 로고    scopus 로고
    • Parameter Variations and Impact on Circuits and Microarchitecture
    • S. Borkar et al., "Parameter Variations and Impact on Circuits and Microarchitecture," Proc. Design Automation Conf. (DAC), pp. 338-342, 2003.
    • (2003) Proc. Design Automation Conf. (DAC) , pp. 338-342
    • Borkar, S.1
  • 8
    • 0036646857 scopus 로고    scopus 로고
    • Hybrid Load-Value Predictors
    • July
    • M. Burtscher and B.G. Zorn, "Hybrid Load-Value Predictors," IEEE Trans. Computers, vol. 51, no. 7, pp. 759-774, July 2002.
    • (2002) IEEE Trans. Computers , vol.51 , Issue.7 , pp. 759-774
    • Burtscher, M.1    Zorn, B.G.2
  • 10
    • 27944470947 scopus 로고    scopus 로고
    • Full-Chip Analysis of Leakage Power under Process Variations, Including Spatial Correlations
    • H. Chang and S. Sapatnekar, "Full-Chip Analysis of Leakage Power under Process Variations, Including Spatial Correlations," Proc. Design Automation Conf. (DAC), pp. 523-528, 2005.
    • (2005) Proc. Design Automation Conf. (DAC) , pp. 523-528
    • Chang, H.1    Sapatnekar, S.2
  • 11
    • 84886474055 scopus 로고    scopus 로고
    • Modeling and Testing of SRAM for New Failure Mechanisms due to Process Variations in Nanoscale CMOS
    • Q. Chen et al., "Modeling and Testing of SRAM for New Failure Mechanisms due to Process Variations in Nanoscale CMOS," Proc. VLSI Testing Symp., pp. 292-297, 2005.
    • (2005) Proc. VLSI Testing Symp , pp. 292-297
    • Chen, Q.1
  • 12
    • 0142196052 scopus 로고    scopus 로고
    • Comparison of Adaptive Body Bias (ABB) and Adaptive Supply Voltage (ASV) for Improving Delay and Leakage under the Presence of Process Variation
    • Oct
    • T. Chen and S. Naffziger, "Comparison of Adaptive Body Bias (ABB) and Adaptive Supply Voltage (ASV) for Improving Delay and Leakage under the Presence of Process Variation," IEEE Trans. VLSI Systems, vol. 11, no. 5, pp. 888-899, Oct. 2003.
    • (2003) IEEE Trans. VLSI Systems , vol.11 , Issue.5 , pp. 888-899
    • Chen, T.1    Naffziger, S.2
  • 14
    • 0027629398 scopus 로고
    • A Load Instruction Unit for Pipelined Processors
    • R.J. Eickemeyer and S. Vassiliadis, "A Load Instruction Unit for Pipelined Processors," IBM J. Research and Development, vol. 37, no. 4, pp. 547-564, 1993.
    • (1993) IBM J. Research and Development , vol.37 , Issue.4 , pp. 547-564
    • Eickemeyer, R.J.1    Vassiliadis, S.2
  • 15
    • 15044339297 scopus 로고    scopus 로고
    • Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation
    • Nov./Dec
    • D. Ernst et al., "Razor: Circuit-Level Correction of Timing Errors for Low-Power Operation," IEEE Micro, vol. 24, no. 6, pp. 10-20, Nov./Dec. 2004.
    • (2004) IEEE Micro , vol.24 , Issue.6 , pp. 10-20
    • Ernst, D.1
  • 16
    • 2942674894 scopus 로고    scopus 로고
    • Post Silicon Power/Performance Optimization in the Presence of Process Variations Using Individual Well Adaptive Body Biasing (IWABB)
    • J. Gregg and T. Chen, "Post Silicon Power/Performance Optimization in the Presence of Process Variations Using Individual Well Adaptive Body Biasing (IWABB)," Proc. IEEE Int'l Symp. Quality Electronic Design (ISQED), pp. 453-458, 2004.
    • (2004) Proc. IEEE Int'l Symp. Quality Electronic Design (ISQED) , pp. 453-458
    • Gregg, J.1    Chen, T.2
  • 20
    • 0032297487 scopus 로고    scopus 로고
    • The Alpha 21264 Microprocessor Architecture
    • Oct./Nov
    • R.E. Kessler et al., "The Alpha 21264 Microprocessor Architecture," IEEE Micro, vol. 19, no. 2, pp. 90-95, Oct./Nov. 1999.
    • (1999) IEEE Micro , vol.19 , Issue.2 , pp. 90-95
    • Kessler, R.E.1
  • 22
    • 33751428197 scopus 로고    scopus 로고
    • Total Power-Optimal Pipelining and Parallel Processing under Process Variations in Nanometer Technology
    • N.S. Kim et al., "Total Power-Optimal Pipelining and Parallel Processing under Process Variations in Nanometer Technology," Proc. Int'l Conf. Computer Aided Design (ICCAD), pp. 535-540, 2005.
    • (2005) Proc. Int'l Conf. Computer Aided Design (ICCAD) , pp. 535-540
    • Kim, N.S.1
  • 24
    • 0033889732 scopus 로고    scopus 로고
    • Device Scaling Effects on Hot-Carrier Induced Interface and Oxide Trapped Charge Distributions in MOSFETs
    • Apr
    • S. Mahapatra et al., "Device Scaling Effects on Hot-Carrier Induced Interface and Oxide Trapped Charge Distributions in MOSFETs," IEEE Trans. Electron Devices, vol. 47, no. 4, pp. 789-796, Apr. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , Issue.4 , pp. 789-796
    • Mahapatra, S.1
  • 25
    • 23844536801 scopus 로고    scopus 로고
    • Precise Instruction Scheduling
    • G. Memik et al., "Precise Instruction Scheduling," J. Instruction-Level Parallelism, vol. 7, pp. 1-29, 2005.
    • (2005) J. Instruction-Level Parallelism , vol.7 , pp. 1-29
    • Memik, G.1
  • 27
    • 0037852928 scopus 로고    scopus 로고
    • Forward Body Bias for Microprocessors in 130 nm Technology Generation and Beyond
    • May
    • S. Narendra et al., "Forward Body Bias for Microprocessors in 130 nm Technology Generation and Beyond," IEEE J. Solid-State Circuits, vol. 38, no. 5, pp. 696-701, May 2003.
    • (2003) IEEE J. Solid-State Circuits , vol.38 , Issue.5 , pp. 696-701
    • Narendra, S.1
  • 31
    • 39749152930 scopus 로고    scopus 로고
    • Impact of Layout on 90 nm CMOS Process Parameter Fluctuations
    • L.T. Pang and B. Nikolic, "Impact of Layout on 90 nm CMOS Process Parameter Fluctuations," Proc. Symp. VLSI Circuits, pp. 69-70, 2006.
    • (2006) Proc. Symp. VLSI Circuits , pp. 69-70
    • Pang, L.T.1    Nikolic, B.2
  • 32
    • 27644553810 scopus 로고    scopus 로고
    • A System-Level Methodology for Fully Compensating Process Variability Impact of Memory Organizations in Periodic Applications
    • A. Papanikolaou et al., "A System-Level Methodology for Fully Compensating Process Variability Impact of Memory Organizations in Periodic Applications," Proc. Int'l Conf. Hardware-Software Codesign and System Synthesis (CODES+ISSS), pp. 117-122, 2005.
    • (2005) Proc. Int'l Conf. Hardware-Software Codesign and System Synthesis (CODES+ISSS) , pp. 117-122
    • Papanikolaou, A.1
  • 33
    • 0035693947 scopus 로고    scopus 로고
    • Reducing Set-Associative Cache Energy via Way-Prediction and Selective Direct-Mapping
    • M.D. Powell et al., "Reducing Set-Associative Cache Energy via Way-Prediction and Selective Direct-Mapping," Proc. 34th Int'l Symp. Microarchitecture (MICRO), pp. 54-65, 2001.
    • (2001) Proc. 34th Int'l Symp. Microarchitecture (MICRO) , pp. 54-65
    • Powell, M.D.1
  • 35
    • 0003450887 scopus 로고    scopus 로고
    • Cacti 3.0: An Integrated Cache Timing, Power, and Area Model,
    • Western Research Lab
    • P. Shivakumar and N.P. Jouppi, "Cacti 3.0: An Integrated Cache Timing, Power, and Area Model," research report, Western Research Lab., 2001.
    • (2001) research report
    • Shivakumar, P.1    Jouppi, N.P.2
  • 38
    • 34547664408 scopus 로고    scopus 로고
    • CACTI 4.0,
    • Technical Report HPL-2006-86
    • D. Tarjan et al., "CACTI 4.0," Technical Report HPL-2006-86, 2006.
    • (2006)
    • Tarjan, D.1
  • 39
    • 0036858210 scopus 로고    scopus 로고
    • Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage
    • Nov
    • J. Tschanz et al., "Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage," IEEE J. Solid-State Circuits, vol. 37, no. 11, pp. 1396-1402, Nov. 2002.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , Issue.11 , pp. 1396-1402
    • Tschanz, J.1
  • 40
    • 34547274406 scopus 로고    scopus 로고
    • Process and Environmental Variation Impacts on ASIC Timing
    • P. Zuchowski et al., "Process and Environmental Variation Impacts on ASIC Timing," Proc. Design Automation Conf. (DAC), pp. 336-342, 2005.
    • (2005) Proc. Design Automation Conf. (DAC) , pp. 336-342
    • Zuchowski, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.