Atomic scale characterization of deformation-induced interfacial mixing in a Cu/V nanocomposite wire

Scripta Materialia

Volumn 61, Issue 6, 2009, Pages 660-663

  Sauvage, X ^a   Genevois, C ^a   Da Costa, G ^a   Pantsyrny, V ^b  

^a UNIVERSITÉ DE ROUEN   (France)

^b Bochvar All Russia Research Institute for Inorganic Materials (VNIINM)   (Russian Federation)

Author keywords

Atom probe tomography; Copper; HAADF STEM; Intermixing; Nanocomposite

Indexed keywords

ATOM PROBE TOMOGRAPHY; ATOMIC SCALE; COLD DRAWING; EXPERIMENTAL DATA; FACE-CENTERED CUBIC; HAADF STEM; INTERFACIAL MIXING; INTERMIXING; MECHANICAL MIXING; MIXED LAYER; NANOSCALED; SUPERSATURATED SOLID SOLUTIONS;

ATOMS; DEFORMATION; DISSOLUTION; FILAMENTS (LAMP); HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCOMPOSITES; POLYMER BLENDS; PROBES; TOMOGRAPHY; VANADIUM; VANADIUM ALLOYS; WIRE; WIRE DRAWING;

MIXING;

EID: 67649817073     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.06.007     Document Type: Article

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