c-Axis correlated extended defects and critical current in YBa2Cu3Ox films grown on Au and Ag-nano dot decorated substrates

Physica C: Superconductivity and its Applications

Volumn 469, Issue 14, 2009, Pages 798-804

  Mikheenko, P ^a   Sarkar, A ^a   Dang, V S ^a   Tanner, J L ^a   Abell, J S ^a   Crisan, A ^a,b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

Critical current; Films; Nanodots; Pinning; Substrate decoration; Superconducting

Indexed keywords

ANGLE-DEPENDENT; DEPOSITION TEMPERATURES; EXTENDED DEFECT; GOLD NANODOTS; HIGH DENSITY; NANODOT; NANODOTS; NANOMETRES; PINNING; SMALL-DIAMETER; SRTIO; SUPERCONDUCTING; SURFACE DENSITY; THICKNESS OF THE FILM; TRANSPORT MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENTS; DEFECTS; FILM GROWTH; GOLD; GOLD DEPOSITS; SILVER; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

SUBSTRATES;

EID: 67649814221     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2009.05.001     Document Type: Article

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