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Volumn , Issue , 2009, Pages 799-805

Variation-tolerant hierarchical voltage monitoring circuit for soft error detection

Author keywords

[No Author keywords available]

Indexed keywords

CHECK POINTING; CRITICAL CHARGE; DETECTION MECHANISM; ENERGY CONSUMPTION; EXTERNAL NOISE; FEATURE SIZES; GENERAL-PURPOSE SYSTEMS; LOGIC ERRORS; MODULAR REDUNDANCY; NANO-METER REGIMES; NICHE MARKETS; NOISE MARGINS; POWER OVERHEAD; PROTECTION TECHNIQUES; SCALE DOWN; SOFT ERROR; SOFT ERROR DETECTION; SUPPLY RAIL; VOLTAGE MONITORING;

EID: 67649640003     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2009.4810395     Document Type: Conference Paper
Times cited : (19)

References (23)
  • 1
    • 29344472607 scopus 로고    scopus 로고
    • Radiation-Induced Soft Errors in Advanced Semiconductor Technologies
    • R. C. Baumann, "Radiation-Induced Soft Errors in Advanced Semiconductor Technologies," IEEE Trans. on Device and Material Reliability , vol. 5, no. 3, pp. 305-316, 2005.
    • (2005) IEEE Trans. on Device and Material Reliability , vol.5 , Issue.3 , pp. 305-316
    • Baumann, R.C.1
  • 2
    • 0018331014 scopus 로고
    • Alpha-Particle-Induced Soft Errors in Dynamic Memories
    • T. C. May and M. H. Woods, "Alpha-Particle-Induced Soft Errors in Dynamic Memories," IEEE Trans. Electron Device, vol. 26, no. 1, pp. 2-9, 1979.
    • (1979) IEEE Trans. Electron Device , vol.26 , Issue.1 , pp. 2-9
    • May, T.C.1    Woods, M.H.2
  • 3
    • 84964893764 scopus 로고    scopus 로고
    • Sun Screen
    • Nov. 2000
    • D. Lyons, "Sun Screen," Forbes, Nov. 2000, http://www.forbes.com/global/2000/1113/0323026a.html.
    • Forbes
    • Lyons, D.1
  • 5
    • 0026237182 scopus 로고
    • High-speed On-Chip ECC for Synergistic Fault-Tolerant Memory Chips
    • J. A. Fifield and C. H. Stapper, "High-speed On-Chip ECC for Synergistic Fault-Tolerant Memory Chips," IEEE Journal of Solid State Circuits, vol. 26, no. 10, pp. 1449-1452, 1991.
    • (1991) IEEE Journal of Solid State Circuits , vol.26 , Issue.10 , pp. 1449-1452
    • Fifield, J.A.1    Stapper, C.H.2
  • 6
    • 0035004322 scopus 로고    scopus 로고
    • Historical Trend in Alpha-Particle induced Soft Error Rates of the Alpha Microprocessor
    • Apr
    • N. Seifert, D. Moyer, N. Leland, and R. Hokinson, "Historical Trend in Alpha-Particle induced Soft Error Rates of the Alpha Microprocessor," in Proc. Int'l Reliability Physics Symp., Apr. 2001, pp. 259-265.
    • (2001) Proc. Int'l Reliability Physics Symp , pp. 259-265
    • Seifert, N.1    Moyer, D.2    Leland, N.3    Hokinson, R.4
  • 8
    • 0024013816 scopus 로고
    • Modulo 3 Residue Checker: New Results on Performance and Cost
    • J. Watterson and J. Hallenbeck, "Modulo 3 Residue Checker: New Results on Performance and Cost," IEEE Transactions on Computers, vol. 37, no. 5, pp. 608-612, 1988.
    • (1988) IEEE Transactions on Computers , vol.37 , Issue.5 , pp. 608-612
    • Watterson, J.1    Hallenbeck, J.2
  • 10
    • 0032684765 scopus 로고    scopus 로고
    • Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies
    • Apr
    • M. Nicolaidis, "Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies," in Proc. IEEE VLSI Test Symp., Apr. 1999, pp. 86-94.
    • (1999) Proc. IEEE VLSI Test Symp , pp. 86-94
    • Nicolaidis, M.1
  • 11
    • 0032667728 scopus 로고    scopus 로고
    • T. Slegel, R. A. III, M. Check, B. Giamei, B. Krumm, C. Krygowski, W. Li, J. Liptay, J. MacDougall, T. McPherson, J. Navarro, E. Schwarz, K. Shum, and C.Webb, IBM's S/390 G5 Microprocessor Design, IEEE Micro, 19, no. 2, pp. 12-23, Mar./Apr. 1999.
    • T. Slegel, R. A. III, M. Check, B. Giamei, B. Krumm, C. Krygowski, W. Li, J. Liptay, J. MacDougall, T. McPherson, J. Navarro, E. Schwarz, K. Shum, and C.Webb, "IBM's S/390 G5 Microprocessor Design," IEEE Micro, vol. 19, no. 2, pp. 12-23, Mar./Apr. 1999.
  • 12
    • 57749181987 scopus 로고    scopus 로고
    • Supporting Highly-Decoupled Thread-Level Redundancy for Parallel Programs
    • Feb
    • M. Rashid and M. Huang, "Supporting Highly-Decoupled Thread-Level Redundancy for Parallel Programs," in Proc. Int'l Symp. on High-Perf. Comp. Arch., Feb. 2008, pp. 393-404.
    • (2008) Proc. Int'l Symp. on High-Perf. Comp. Arch , pp. 393-404
    • Rashid, M.1    Huang, M.2
  • 14
    • 0015765055 scopus 로고
    • STAREX Self-Repair Routines: Software Recovery in the JPL-STAR Computer
    • J. Rohr, "STAREX Self-Repair Routines: Software Recovery in the JPL-STAR Computer," in International Symposium on Fault-Tolerant Computing, 1973, pp. 11-16.
    • (1973) International Symposium on Fault-Tolerant Computing , pp. 11-16
    • Rohr, J.1
  • 16
    • 0025419124 scopus 로고
    • Error Recovery in Shared Memory Multiprocessors Using Private Caches
    • Apr
    • K. Wu, W. Fuchs, and J. Patel, "Error Recovery in Shared Memory Multiprocessors Using Private Caches," IEEE Transactions on Parallel and Distributed Systems, vol. 1, no. 2, pp. 231-240, Apr. 1990.
    • (1990) IEEE Transactions on Parallel and Distributed Systems , vol.1 , Issue.2 , pp. 231-240
    • Wu, K.1    Fuchs, W.2    Patel, J.3
  • 17
    • 33750382289 scopus 로고    scopus 로고
    • Using Bulk Built-in Current Sensors to Detect Soft Errors
    • Sept/Oct
    • E. Neto, I. Ribeiro, M. Vieira, G. Wirth, and F. Kastensmidt, "Using Bulk Built-in Current Sensors to Detect Soft Errors," IEEE Micro, vol. 26, no. 5, pp. 10-18, Sept/Oct, 2006.
    • (2006) IEEE Micro , vol.26 , Issue.5 , pp. 10-18
    • Neto, E.1    Ribeiro, I.2    Vieira, M.3    Wirth, G.4    Kastensmidt, F.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.