-
1
-
-
29344472607
-
Radiation-Induced Soft Errors in Advanced Semiconductor Technologies
-
R. C. Baumann, "Radiation-Induced Soft Errors in Advanced Semiconductor Technologies," IEEE Trans. on Device and Material Reliability , vol. 5, no. 3, pp. 305-316, 2005.
-
(2005)
IEEE Trans. on Device and Material Reliability
, vol.5
, Issue.3
, pp. 305-316
-
-
Baumann, R.C.1
-
2
-
-
0018331014
-
Alpha-Particle-Induced Soft Errors in Dynamic Memories
-
T. C. May and M. H. Woods, "Alpha-Particle-Induced Soft Errors in Dynamic Memories," IEEE Trans. Electron Device, vol. 26, no. 1, pp. 2-9, 1979.
-
(1979)
IEEE Trans. Electron Device
, vol.26
, Issue.1
, pp. 2-9
-
-
May, T.C.1
Woods, M.H.2
-
3
-
-
84964893764
-
Sun Screen
-
Nov. 2000
-
D. Lyons, "Sun Screen," Forbes, Nov. 2000, http://www.forbes.com/global/2000/1113/0323026a.html.
-
Forbes
-
-
Lyons, D.1
-
4
-
-
0036931372
-
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
-
P. Shivakumar,M. Kistler, S. Keckler, D. Burger, and L. Alvisi, "Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic," in Proc. Int'l Conf. Dependable Systems and Networks, 2002, pp. 389-398.
-
(2002)
Proc. Int'l Conf. Dependable Systems and Networks
, pp. 389-398
-
-
Shivakumar, P.1
Kistler, M.2
Keckler, S.3
Burger, D.4
Alvisi, L.5
-
5
-
-
0026237182
-
High-speed On-Chip ECC for Synergistic Fault-Tolerant Memory Chips
-
J. A. Fifield and C. H. Stapper, "High-speed On-Chip ECC for Synergistic Fault-Tolerant Memory Chips," IEEE Journal of Solid State Circuits, vol. 26, no. 10, pp. 1449-1452, 1991.
-
(1991)
IEEE Journal of Solid State Circuits
, vol.26
, Issue.10
, pp. 1449-1452
-
-
Fifield, J.A.1
Stapper, C.H.2
-
6
-
-
0035004322
-
Historical Trend in Alpha-Particle induced Soft Error Rates of the Alpha Microprocessor
-
Apr
-
N. Seifert, D. Moyer, N. Leland, and R. Hokinson, "Historical Trend in Alpha-Particle induced Soft Error Rates of the Alpha Microprocessor," in Proc. Int'l Reliability Physics Symp., Apr. 2001, pp. 259-265.
-
(2001)
Proc. Int'l Reliability Physics Symp
, pp. 259-265
-
-
Seifert, N.1
Moyer, D.2
Leland, N.3
Hokinson, R.4
-
7
-
-
0001749167
-
On Checking an Adder
-
Apr
-
W. Peterson, "On Checking an Adder," IBM Journal of Research and Development, vol. 2, no. 2, pp. 166-168, Apr. 1958.
-
(1958)
IBM Journal of Research and Development
, vol.2
, Issue.2
, pp. 166-168
-
-
Peterson, W.1
-
8
-
-
0024013816
-
Modulo 3 Residue Checker: New Results on Performance and Cost
-
J. Watterson and J. Hallenbeck, "Modulo 3 Residue Checker: New Results on Performance and Cost," IEEE Transactions on Computers, vol. 37, no. 5, pp. 608-612, 1988.
-
(1988)
IEEE Transactions on Computers
, vol.37
, Issue.5
, pp. 608-612
-
-
Watterson, J.1
Hallenbeck, J.2
-
9
-
-
4444365711
-
Measurements and Analysis of SER-Tolerant Latch in a 90-nm Dual-Vt CMOS Process
-
Sept
-
P. Hazucha, T. Karnik, S. Walstra, B. Bloechel, J. Tschanz, J. Maiz, K. Soumyanath, G. Dermer, S. Narendra, V. De, and S. Borkar, "Measurements and Analysis of SER-Tolerant Latch in a 90-nm Dual-Vt CMOS Process," IEEE Journal of Solid-State Circuits, vol. 39, no. 9, pp. 1536-1543, Sept. 2004.
-
(2004)
IEEE Journal of Solid-State Circuits
, vol.39
, Issue.9
, pp. 1536-1543
-
-
Hazucha, P.1
Karnik, T.2
Walstra, S.3
Bloechel, B.4
Tschanz, J.5
Maiz, J.6
Soumyanath, K.7
Dermer, G.8
Narendra, S.9
De, V.10
Borkar, S.11
-
10
-
-
0032684765
-
Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies
-
Apr
-
M. Nicolaidis, "Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies," in Proc. IEEE VLSI Test Symp., Apr. 1999, pp. 86-94.
-
(1999)
Proc. IEEE VLSI Test Symp
, pp. 86-94
-
-
Nicolaidis, M.1
-
11
-
-
0032667728
-
-
T. Slegel, R. A. III, M. Check, B. Giamei, B. Krumm, C. Krygowski, W. Li, J. Liptay, J. MacDougall, T. McPherson, J. Navarro, E. Schwarz, K. Shum, and C.Webb, IBM's S/390 G5 Microprocessor Design, IEEE Micro, 19, no. 2, pp. 12-23, Mar./Apr. 1999.
-
T. Slegel, R. A. III, M. Check, B. Giamei, B. Krumm, C. Krygowski, W. Li, J. Liptay, J. MacDougall, T. McPherson, J. Navarro, E. Schwarz, K. Shum, and C.Webb, "IBM's S/390 G5 Microprocessor Design," IEEE Micro, vol. 19, no. 2, pp. 12-23, Mar./Apr. 1999.
-
-
-
-
12
-
-
57749181987
-
Supporting Highly-Decoupled Thread-Level Redundancy for Parallel Programs
-
Feb
-
M. Rashid and M. Huang, "Supporting Highly-Decoupled Thread-Level Redundancy for Parallel Programs," in Proc. Int'l Symp. on High-Perf. Comp. Arch., Feb. 2008, pp. 393-404.
-
(2008)
Proc. Int'l Symp. on High-Perf. Comp. Arch
, pp. 393-404
-
-
Rashid, M.1
Huang, M.2
-
13
-
-
0036999678
-
Designing A Single Board Computer For Space Using The Most Advanced Processor and Mitigation Technologies
-
Sept
-
L. Longden, C. Thibodeau, R. Hillman, P. Layton, and M. Dowd, "Designing A Single Board Computer For Space Using The Most Advanced Processor and Mitigation Technologies," in European Space Components Conference, ESCCON 2002, Sept. 2002, pp. 313-316.
-
(2002)
European Space Components Conference, ESCCON 2002
, pp. 313-316
-
-
Longden, L.1
Thibodeau, C.2
Hillman, R.3
Layton, P.4
Dowd, M.5
-
14
-
-
0015765055
-
STAREX Self-Repair Routines: Software Recovery in the JPL-STAR Computer
-
J. Rohr, "STAREX Self-Repair Routines: Software Recovery in the JPL-STAR Computer," in International Symposium on Fault-Tolerant Computing, 1973, pp. 11-16.
-
(1973)
International Symposium on Fault-Tolerant Computing
, pp. 11-16
-
-
Rohr, J.1
-
15
-
-
0024142151
-
The Implementation and Application of Micro Rollback in Fault-Tolerant VLSI Systems
-
June
-
Y. Tamir, M. Tremblay, and D. Rennels, "The Implementation and Application of Micro Rollback in Fault-Tolerant VLSI Systems," in International Symposium on Fault-Tolerant Computing, June 1988, pp. 234-239.
-
(1988)
International Symposium on Fault-Tolerant Computing
, pp. 234-239
-
-
Tamir, Y.1
Tremblay, M.2
Rennels, D.3
-
16
-
-
0025419124
-
Error Recovery in Shared Memory Multiprocessors Using Private Caches
-
Apr
-
K. Wu, W. Fuchs, and J. Patel, "Error Recovery in Shared Memory Multiprocessors Using Private Caches," IEEE Transactions on Parallel and Distributed Systems, vol. 1, no. 2, pp. 231-240, Apr. 1990.
-
(1990)
IEEE Transactions on Parallel and Distributed Systems
, vol.1
, Issue.2
, pp. 231-240
-
-
Wu, K.1
Fuchs, W.2
Patel, J.3
-
17
-
-
33750382289
-
Using Bulk Built-in Current Sensors to Detect Soft Errors
-
Sept/Oct
-
E. Neto, I. Ribeiro, M. Vieira, G. Wirth, and F. Kastensmidt, "Using Bulk Built-in Current Sensors to Detect Soft Errors," IEEE Micro, vol. 26, no. 5, pp. 10-18, Sept/Oct, 2006.
-
(2006)
IEEE Micro
, vol.26
, Issue.5
, pp. 10-18
-
-
Neto, E.1
Ribeiro, I.2
Vieira, M.3
Wirth, G.4
Kastensmidt, F.5
-
18
-
-
29344440163
-
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories
-
B. Gill, M. Nicolaidis, F. Wolff, C. Papachristou, and S. Garverick, "An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories," in Proc. Design, Automation and Test in Europe, 2005, pp. 592-597.
-
(2005)
Proc. Design, Automation and Test in Europe
, pp. 592-597
-
-
Gill, B.1
Nicolaidis, M.2
Wolff, F.3
Papachristou, C.4
Garverick, S.5
-
19
-
-
42649146134
-
Soft Error Reduction in Combinational Logic Using Gate Resizing and Flipflop Selection
-
R. Rao, D. Blaauw, and D. Sylvester, "Soft Error Reduction in Combinational Logic Using Gate Resizing and Flipflop Selection," in Proc. 11th IEEE/ACM Int'l Conference on Computeraided Design, 2006, pp. 502-509.
-
(2006)
Proc. 11th IEEE/ACM Int'l Conference on Computeraided Design
, pp. 502-509
-
-
Rao, R.1
Blaauw, D.2
Sylvester, D.3
-
20
-
-
33745491657
-
Radiation Induced Single-Word Multi-bit Upsets Correction in SRAM
-
B. Gill, M. Nicolaidis, and C. Papachristou, "Radiation Induced Single-Word Multi-bit Upsets Correction in SRAM," in Proc. 11th IEEE Int'l On-Line Testing Symposium, 2005, pp. 266-271.
-
(2005)
Proc. 11th IEEE Int'l On-Line Testing Symposium
, pp. 266-271
-
-
Gill, B.1
Nicolaidis, M.2
Papachristou, C.3
-
22
-
-
33748537704
-
A Soft Error Monitor Using Switching Current Detection
-
P. Ndai, A. Agrawal, Q. Chen, and K. Roy, "A Soft Error Monitor Using Switching Current Detection," in Proc. Int'l Conference on Computer Design, 2005, pp. 185 - 190.
-
(2005)
Proc. Int'l Conference on Computer Design
, pp. 185-190
-
-
Ndai, P.1
Agrawal, A.2
Chen, Q.3
Roy, K.4
-
23
-
-
34548127914
-
A TMR Scheme for SEU Mitigation in Scan Flip-Flops
-
R. Oliveira, A. Jagirdar, and T. Chakraborty, "A TMR Scheme for SEU Mitigation in Scan Flip-Flops," in Proc. 8th Int'l Symposium on Quality Electronic Design, 2007, pp. 905-910.
-
(2007)
Proc. 8th Int'l Symposium on Quality Electronic Design
, pp. 905-910
-
-
Oliveira, R.1
Jagirdar, A.2
Chakraborty, T.3
|