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Volumn 58, Issue 7, 2009, Pages 2072-2079

A new microwave axial tomograph for the inspection of dielectric materials

Author keywords

Imaging systems; Inverse problems; Microwave tomography; Nondestructive testing; Radar

Indexed keywords

BISTATIC; FORWARD SCATTERING; HARDWARE AND SOFTWARE; INEXACT NEWTON METHOD; MICROWAVE TOMOGRAPHY; NONDESTRUCTIVE TESTING; SCATTERED DATA; SYNTHETIC DATA; TOMOGRAPH; WORKING CONDITIONS;

EID: 67649621679     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2015521     Document Type: Conference Paper
Times cited : (33)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.