Modelling microstructures with OOF2

International Journal of Materials and Product Technology

Volumn 35, Issue 3-4, 2009, Pages 361-373

  Reid, Andrew C E ^a   Lua, Rhonald C ^b   García, R Edwin ^c   Coffman, Valerie R ^b   Langer, Stephen A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

Finite element; Microstructure

Indexed keywords

FINITE ELEMENT METHOD; INDUSTRIAL ENGINEERING; MECHANICAL ENGINEERING;

GEOMETRICAL COMPLEXITY; IMPORTANT FEATURES; MATERIAL MICROSTRUCTURES; MATERIALS SCIENTIST; PHYSICAL PHENOMENA;

MICROSTRUCTURE;

EID: 67649525171     PISSN: 02681900     EISSN: None     Source Type: Journal    
DOI: 10.1504/ijmpt.2009.025687     Document Type: Article

References (3)

1. Langer, S. A., Fuller Jr., E. R. and Carter, W. C. (2001) 'OOF: an image-based finite-element analysis of material microstructures', Computing in Science and Engineering, Vol. 3, No. 3, p. 15.
2. Paul, F. B., Sun, E. Y., Plucknett, K. P., Alexander, K. B., Hsueh, C-H., Lin, H-T., Waters, S. B., Westmoreland, C. G., Kang, E-S., Hirao, K. and Brito, M. E. (1998) 'Microstructural design of silicon nitride with improved fracture toughness: I, effects of grain shape and size', Journal of the American Ceramic Society, Vol. 81, No. 11, pp. 2821-2830.
3. Zienkiewicz, O. C. and Taylor, R. L. (2000) The Finite Element Method, 5th ed., Vol. 1, Butterworth Hienemann, Oxford, p. 91.