Directional emission and universal far-field behavior from semiconductor lasers with lima̧on-shaped microcavity

Applied Physics Letters

Volumn 94, Issue 25, 2009, Pages

  Yan, Changling ^a,b   Wang, Qi Jie ^a   Diehl, Laurent ^a   Hentschel, Martina ^c   Wiersig, Jan ^d   Yu, Nanfang ^a   Pflügl, Christian ^a   Capasso, Federico ^a   Belkin, Mikhail A ^e   Edamura, Tadataka ^f   Yamanishi, Masamichi ^f   Kan, Hirofumi ^f  

^a HARVARD UNIVERSITY   (United States)

^b CHANGCHUN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c MAX PLANCK INSTITUT FÜR PHYSIK KOMPLEXER SYSTEME   (Germany)

^d OTTO VON GUERICKE UNIVERSITY   (Germany)

^e The University of Texas at Austin   (United States)

^f CENTRAL RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DIVERGENCE; COMPLEX MODES; DIRECTIONAL EMISSION; FAR-FIELD; HIGH QUALITY; HIGH QUALITY FACTORS; MICROCAVITY LASER; MODEL SYSTEM; OPTIMUM VALUE; PUMPING CURRENT; RAY OPTICS; RIDGE LASER; WAVE SIMULATIONS;

DEFORMATION; EMISSION SPECTROSCOPY; HETEROJUNCTIONS; LASERS; LIGHT; MICROCAVITIES; PUMPS;

SEMICONDUCTOR LASERS;

EID: 67649518168     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3153276     Document Type: Article

References (18)

1. K. J. Vahala, Nature (London) 0028-0836 424, 839 (2003). 10.1038/nature01939
2. A. F. J. Levi, R. E. Slusher, S. L. McCall, J. L. Glass, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 0003-6951 62, 561 (1993). 10.1063/1.108911
3. Optical Processes in Microcavities, edited by, R. K. Chang, and, A. J. Campillo, (World Scientific, New York, 1996).
4. J. U. Nöckel and A. D. Stone, Nature (London) 0028-0836 385, 45 (1997). 10.1038/385045a0
5. W. Fang, H. Cao, and G. S. Solomon, Appl. Phys. Lett. 0003-6951 90, 081108 (2007). 10.1063/1.2535692
6. C. Gmachl, F. Capasso, E. E. Narimanov, J. U. Nöckel, A. D. Stone, J. Faist, D. L. Sivco, and A. Y. Cho, Science 0036-8075 280, 1556 (1998). 10.1126/science.280.5369.1556
7. G. D. Chern, H. E. Tureci, A. D. Stone, R. K. Chang, M. Kneissl, and N. M. Johnson, Appl. Phys. Lett. 0003-6951 83, 1710 (2003). 10.1063/1.1605792
8. R. Audet, M. A. Belkin, J. A. Fan, B. G. Lee, K. Lin, F. Capasso, E. E. Narimanov, D. Bour, S. Corzine, J. Zhu, and G. Höfler, Appl. Phys. Lett. 0003-6951 91, 131106 (2007). 10.1063/1.2784290
9. D. X. Qu, R. Cendejas, Z. J. Liu, C. Gmachl, and F. Towner, Appl. Phys. Lett. 0003-6951 93, 261116 (2008). 10.1063/1.3058679
10. Y. Baryshnikov, P. Heider, W. Parz, and V. Zharnitsky, Phys. Rev. Lett. 0031-9007 93, 133902 (2004). 10.1103/PhysRevLett.93.133902
11. J. Wiersig and M. Hentschel, Phys. Rev. A 1050-2947 73, 031802 (R) (2006). 10.1103/PhysRevA.73.031802
12. M. Hentschel and T. -Y. Kwon, Opt. Lett. 0146-9592 34, 163 (2009). 10.1364/OL.34.000163
13. J. Wiersig and M. Hentschel, Phys. Rev. Lett. 0031-9007 100, 033901 (2008). 10.1103/PhysRevLett.100.033901
14. S. -B. Lee, J. Yang, S. Moon, J. -H. Lee, K. An, J. -B. Shim, H. -W. Lee, and S. W. Kim, Phys. Rev. A 1050-2947 75, 011802 (R) (2007). 10.1103/PhysRevA.75.011802
15. N. Yu, J. Fan, Q. J. Wang, C. Pflügl, L. Diehl, T. Edamura, M. Yamanishi, H. Kan, and F. Capasso, Nat. Photonics 1749-4885 2, 564 (2008). 10.1038/nphoton.2008.152
16. C. Gmachl, J. Faist, F. Capasso, C. Sirtori, D. L. Sivco, and A. Y. Cho, IEEE J. Quantum Electron. 0018-9197 33, 1567 (1997). 10.1109/3.622638
17. J. Faist, C. Gmachl, M. Striccoli, C. Sirtori, F. Capasso, D. L. Sivco, and A. Y. Cho, Appl. Phys. Lett. 0003-6951 69, 2456 (1996). 10.1063/1.117496
18. S. Gianordoli, L. Hvozdara, G. Strasser, W. Schrenk, K. Unterrainer, and E. Gornik, Appl. Phys. Lett. 0003-6951 75, 1045 (1999). 10.1063/1.124591