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Volumn 55, Issue 4, 2009, Pages 399-404
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Characterization of isolated defects for NIF targets using PSDI with an analysis of shell flipping capability
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Author keywords
Isolated defect; PDSI; Shell flipper
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHARGE COUPLED DEVICES;
COMPLEMENTARY TOOLS;
DIFFRACTION INTERFEROMETERS;
LAWRENCE LIVERMORE NATIONAL LABORATORIES;
NATIONAL IGNITION FACILITY;
NYQUIST SAMPLING THEOREM;
PDSI;
SHELL FLIPPER;
WHITE-LIGHT INTERFEROMETRY;
SHELLS (STRUCTURES);
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EID: 67649497198
PISSN: 15361055
EISSN: None
Source Type: Journal
DOI: 10.13182/fst08-3493 Document Type: Article |
Times cited : (23)
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References (11)
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