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Volumn 19, Issue 3, 2009, Pages 1444-1447

Impact of cabling pattern, magnet field profile and joint properties on short sample qualification tests of ITER conductors

Author keywords

Cable model; Cable in conduit conductors; Nonuniform currents; Testing

Indexed keywords

CABLE MODEL; CABLE-IN-CONDUIT CONDUCTORS; EXTRA SETS; FIELD PROFILE; JOINT PROPERTY; LINEAR RELATIONSHIPS; NONUNIFORM CURRENT DISTRIBUTIONS; NONUNIFORM CURRENTS; NUMERICAL MODELS; QUALIFICATION TEST; SHORT SAMPLE; VOLTAGE SIGNALS;

EID: 67649493024     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2019429     Document Type: Conference Paper
Times cited : (8)

References (10)
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  • 2
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    • (2007)
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  • 4
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    • Interpretation of conduit voltage measurement on the poloidal field insert sample using the CUDI-CICC numerical code
    • Y. Ilyin, A. Nijhuis, and H. H. J. ten Kate, "Interpretation of conduit voltage measurement on the poloidal field insert sample using the CUDI-CICC numerical code," Cryogenics, vol. 46, pp. 517-529,2006.
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    • Ilyin, Y.1    Nijhuis, A.2    ten Kate, H.H.J.3
  • 5
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    • Electromagnetic modeling of the jacket in cable-in-conduit conductors
    • March
    • M. Breschi and P. L. Ribani, "Electromagnetic modeling of the jacket in cable-in-conduit conductors," IEEE Trans. Appl. Supercond., vol. 18, pp. 18-28, March 2008.
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  • 6
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    • Testing large CICC in short sample configuration and predicting their performance in large magnets
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  • 7
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    • New model to study the influence of cabling pattern, magnetic field profile and joint properties on short sample qualification tests of ITER CICCs
    • Seoul, Korea
    • E. P. A. van Lanen, Y. Miyoshi, Y. Ilyin, M. Dhalle, H. H. J. ten Kate, and A. Nijhuis, "New model to study the influence of cabling pattern, magnetic field profile and joint properties on short sample qualification tests of ITER CICCs," in ICEC 22-ICMC 2008, Seoul, Korea, 2008.
    • (2008) ICEC 22-ICMC 2008
    • van Lanen, E.P.A.1    Miyoshi, Y.2    Ilyin, Y.3    Dhalle, M.4    ten Kate, H.H.J.5    Nijhuis, A.6
  • 8
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    • Effect of cyclic loading and conductor layout on contact resistance of full-size ITER PFCI conductors
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    • Y. Ilyin et al., "Effect of cyclic loading and conductor layout on contact resistance of full-size ITER PFCI conductors," IEEE Trans. Appl. Supercond., vol. 15, pp. 1359-1362, June 2005.
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  • 10


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.