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K can be estimated by K=[1+αln (d/)]-1/2 where α=2π2e2/vF and is the bulk dielectric constant. The distance d from the QW layer to a nearby metallic gate acts as a screening length for the Coulomb potential, and is a microscopic length scale =max {ξ,w} which acts as a short-distance cutoff for the Coulomb potential, where w is the thickness of the QW layer.
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