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Volumn 49, Issue 7, 2009, Pages 800-805

Prototyping of a reliable 3D flexible IC cube package by laser micromachining

Author keywords

[No Author keywords available]

Indexed keywords

3-D PACKAGES; 3D STRUCTURE; APPLICATION OF LASER; AREA REDUCTION; CHIP COOLING; CONTACT PADS; FABRICATION PROCESS; FLEXIBLE CIRCUIT; FLEXIBLE SUBSTRATE; IC CHIPS; LASER MICRO-MACHINING; MATERIAL REMOVING; MECHANICAL INTEGRITY; NARROW LINES; PRINTED WIRING; PROTOTYPING; STACKED PACKAGE; THREE-DIMENSIONAL (3D); UNIQUE FEATURES; UV LASERS;

EID: 67649451982     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.03.015     Document Type: Article
Times cited : (10)

References (16)
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    • Illyefalvi-Vitéz Zs. Laser processing for microelectronics packaging applications. Microelectron Reliab 41 (2001) 563-570
    • (2001) Microelectron Reliab , vol.41 , pp. 563-570
    • Illyefalvi-Vitéz, Zs.1
  • 3
    • 67649423102 scopus 로고    scopus 로고
    • Yole Development. Market trends for 3D stacking. In: EMC 3D; June 2007.
    • Yole Development. Market trends for 3D stacking. In: EMC 3D; June 2007.
  • 6
    • 67649436429 scopus 로고    scopus 로고
    • Ultra-high density interconnect flex substrates
    • Chou B., Solomon B., and Hunt J. Ultra-high density interconnect flex substrates. High Density Interconn December (1998) 14-21
    • (1998) High Density Interconn , Issue.December , pp. 14-21
    • Chou, B.1    Solomon, B.2    Hunt, J.3
  • 10
    • 67649426179 scopus 로고    scopus 로고
    • High performance, high density base material
    • Michael W. High performance, high density base material. In: IPC Expo 1998. Workshop W-09; 1998.
    • (1998) IPC Expo 1998. Workshop W-09
    • Michael, W.1
  • 12
    • 67649454360 scopus 로고    scopus 로고
    • JEDEC Standard No. 22-A100-B. Cycled temperature-humidity-bias life test. Solid State Technology Assoc; April 2000.
    • JEDEC Standard No. 22-A100-B. Cycled temperature-humidity-bias life test. Solid State Technology Assoc; April 2000.
  • 13
    • 67649444719 scopus 로고    scopus 로고
    • JEDEC Standard JESD22-B111. Board level drop test method of components for handheld electronic products. JEDEC Solid State Technology Assoc; 2003.
    • JEDEC Standard JESD22-B111. Board level drop test method of components for handheld electronic products. JEDEC Solid State Technology Assoc; 2003.
  • 15
    • 67649439556 scopus 로고    scopus 로고
    • Laser manufacturing of mechanical structures in flexible substrates
    • Wroclaw, Poland, October;
    • Richárd Berényi, Zsolt Illyefalvi-Vitéz. Laser manufacturing of mechanical structures in flexible substrates. In: Polytronic, 2005, Wroclaw, Poland, 23-26, October; 2005.
    • (2005) Polytronic, 2005 , pp. 23-26
    • Berényi, R.1    Illyefalvi-Vitéz, Z.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.