Position-sensitive ion detection in precision Penning trap mass spectrometry

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 606, Issue 3, 2009, Pages 475-483

  Eitel, G ^a   Block, M ^b   Czasch, A ^c   Dworschak, M ^b   George, S ^a,d   Jagutzki, O ^c   Ketelaer, J ^a   Ketter, J ^a   Nagy, Sz ^b,d   Rodriguez D ^e   Smorra, C ^a,f   Blaum, K ^d,f  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^c GOETHE UNIVERSITY   (Germany)

^d MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^e UNIVERSITY OF GRANADA   (Spain)

^f UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Beam diagnostics; Delay line detector; Ion optics; Penning trap mass spectrometry; Position sensitive ion detection; TOF ICR

Indexed keywords

BEAM DIAGNOSTICS; DELAY-LINE DETECTOR; ION OPTICS; PENNING TRAP MASS SPECTROMETRY; POSITION-SENSITIVE ION DETECTION; TOF-ICR;

IONS; MASS SPECTROMETERS; MASS SPECTROMETRY; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DETECTORS;

EID: 67649425333     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.04.046     Document Type: Article

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